| AVS 45th International Symposium | |
| Nanometer-scale Science and Technology Division | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | NS+AS-WeM1 Invited Paper Recent Progress in the Functionalisation of AFM Probes using Electron-Beam Nanolithography H. Zhou, G.M. Mills, B.K. Chong, L. Donaldson, J.M.R. Weaver, Glasgow University, Scotland |
| 9:00am | NS+AS-WeM3 Surface Derivatization of Nanoscale Tungsten Tips for Interfacial Force Microscopy K. Griffiths, P.R. Norton, J.F. Graham, M. Kovar, F. Ogini, O.L. Warren, University of Western Ontario, Canada |
| 9:20am | NS+AS-WeM4 Silicon Cantilevers for Ultrahigh-Density Data Storage A. Kikukawa, H. Koyanagi, K. Etoh, S. Hosaka, Hitachi Ltd., Japan |
| 9:40am | NS+AS-WeM5 Capacitative Force Modulation Technique in Nanoindentation S. Asif, K.J. Wahl, R.J. Colton, Naval Research Laboratory, S.G. Corcoran, Hysitron, Inc. |
| 10:00am | NS+AS-WeM6 Nanoindentation as a Probe of Stress State K.F. Jarausch, North Carolina State University, J.D. Kiely, J.E. Houston, Sandia National Laboratories, P.E. Russell, North Carolina State University |
| 10:20am | NS+AS-WeM7 Nano-scale Observations of Stress-Enhanced Dissolution in Monoclinic CaHPO@sub4@ 2H@sub 2@O: Chemical vs. Mechanical Effects S.C. Langford, L. Scudiero, J.T. Dickinson, Washington State University |
| 10:40am | NS+AS-WeM8 Conductance and Force at an Atomically Defined Junction G. Cross, A. Schirmeisen, A. Stalder, P. Grütter, McGill University, Canada, U. Dürig, IBM Research Division, Switzerland |
| 11:00am | NS+AS-WeM9 Chemical Imaging with Scanning Near Field Infrared Microscopy C.A. Michaels, R.R. Cavanagh, S.J. Stranick, L.J. Richter, National Institute of Standards and Technology |
| 11:20am | NS+AS-WeM10 Tapping-Mode and Nonoptical Force Sensing Near-Field Scanning Optical Microscopy D.P. Tsai, Y.Y. Lu, National Chung Cheng University, Taiwan |
| 11:40am | NS+AS-WeM11 Development and Application of a Dual-Probe Scanning Tunneling Microscope for Nanoscale Investigations of Materials H. Grube, M. Allgeier, J.J. Boland, University of North Carolina, Chapel Hill |