AVS 45th International Symposium
    Nanometer-scale Science and Technology Division Wednesday Sessions
       Session NS+AS-WeM

Paper NS+AS-WeM3
Surface Derivatization of Nanoscale Tungsten Tips for Interfacial Force Microscopy

Wednesday, November 4, 1998, 9:00 am, Room 321/322/323

Session: Innovative Force, Near-Field Optics, and Tunneling Measurements
Presenter: K. Griffiths, University of Western Ontario, Canada
Authors: K. Griffiths, University of Western Ontario, Canada
P.R. Norton, University of Western Ontario, Canada
J.F. Graham, University of Western Ontario, Canada
M. Kovar, University of Western Ontario, Canada
F. Ogini, University of Western Ontario, Canada
O.L. Warren, University of Western Ontario, Canada
Correspondent: Click to Email
Interfacial force microscopy (IFM) is a novel technique not only for imaging surfaces at resolutions approaching those obtainable with atomic force microscopy, but also for the quantitative determination of the mechanical properties of a material such as elastic modulus, hardness etc., with lateral resolutions of ~nm and depth resolutions ~0.1 nm. The IFM force-compensated sensor permits the acquisition of quantitative force (f) versus distance (d) curves, which through appropriate analysis yield the mechanical properties. Because of the extreme pressures that can be attained in tip-surface contact (many GPa), it is essential to passivate the chemical interactions between the probe tip and the substrate under investigation to prevent strong adhesion effects such as metal-metal bond formation. Studies on Au surfaces are feasible because of the efficacy of self-assembled thiol monolayers on Au. However, convenient and effective protective monolayers are not generally available for many substrates, and it is best to develop a general procedure of passivating the probe tip. Our present studies involve parabaloidal tungsten tips of radii 25