| AVS 45th International Symposium | |
| Applied Surface Science Division | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| AS-ThP1 Mass Spectral Frequency Plots: A New Tool For Static SIMS Data Interpretation A.M. Spool, IBM Corporation |
| AS-ThP2 The Münster High Mass Resolution Static SIMS Library B.C. Schwede, University of Münster, Germany, T. Heller, D. Rading, E. Niehuis, ION-TOF GmbH, Germany, B. Hagenhoff, TASCON GmbH, Germany, L. Wiedmann, A. Benninghoven, University of Münster, Germany |
| AS-ThP3 Formation of Alkanethiol Self-Assembled Monolayers on Oxidized Gold Surfaces C. Yan, A. Gölzhäuser, M. Grunze, Universität Heidelberg, Germany, C. Wöll, Ruhr-Universität-Bochum, Germany |
| AS-ThP4 XPS and ISS Study of X-ray Damage of Alkanethiol Self-Assembled Monolayers on Gold and Silver D.E. King, L.S. Dake, A.W. Czanderna, National Renewable Energy Laboratory |
| AS-ThP5 Identification of Halogen Atoms in STM Images of Substituted Phenyloctadecylethers H.S. Lee, S. Iyengar, I.H. Musselman, University of Texas, Dallas |
| AS-ThP6 Identification of Surface Nitrogen Functionalities Using Gas Phase Derivatization and XPS Analysis Y. Liu, L.J. Gerenser, P.M. Thompson, J.M. Grace, Eastman Kodak Company |
| AS-ThP7 In-situ Characterization of Plasma Polymerized Films Using External Reflection Infrared Spectroscopy F.J. Boerio, R.H. Turner, University of Cincinnati |
| AS-ThP8 X-Ray Microanalysis Inverse Modeling@footnote 1@ H.W. Wagner, W.S.M. Werner, H. Störi, Technische Universität Wien, Austria |
| AS-ThP9 Analysis of X-ray Growth Oscillations During Heteroepitaxy J. Baker, Risoe National Laboratory, Japan, F. Berg Rasmussen, M. Nielsen, R. Feidenhans'l, Risoe National Laboratory, Denmark |
| AS-ThP10 Surface X-ray Diffractometer for MOVPE growth at SPring-8 T. Kawamura, Y. Utsumi, M. Sugiyama, Y. Watanabe, NTT Basic Research Laboratories, Japan, J. Matsui, Y. Kagoshima, Y. Tsusaka, Himeji Institute of Technology, Japan |
| AS-ThP11 Quantitative Wafer Surface Trace Metal Analysis by TXRF and Surface SIMS J.M. Metz, S.P. Smith, M.J. Edgell, V.K.F. Chia, Charles Evans & Associates |
| AS-ThP12 AFM Explanation of the Improved Resolution in Auger Depth Profiles by Using the Zalar Rotation L. Lozzi, S. Santucci, D. Pacifico, P. Picozzi, Università dell'Aquila, Italy, R. Alfonsetti, Texas Instruments ITALIA |
| AS-ThP13 Structure of Plasma Polymerized SiO@sub2@Films: Corrosion Protection of Steel and Aluminum Substrates R.G. Dillingham, Brighton Technologies Group, Inc., F.J. Boerio, University of Cincinnati |