AVS 45th International Symposium
    Applied Surface Science Division Thursday Sessions
       Session AS-ThP

Paper AS-ThP9
Analysis of X-ray Growth Oscillations During Heteroepitaxy

Thursday, November 5, 1998, 5:30 pm, Room Hall A

Session: Aspects of Applied Surface Science Poster Session
Presenter: J. Baker, Risoe National Laboratory, Japan
Authors: J. Baker, Risoe National Laboratory, Japan
F. Berg Rasmussen, Risoe National Laboratory, Denmark
M. Nielsen, Risoe National Laboratory, Denmark
R. Feidenhans'l, Risoe National Laboratory, Denmark
Correspondent: Click to Email
Despite recent progress,@footnote 1@ x-ray intensity oscillations recorded during heteroepitaxial growth are an under-exploited source of information on buried interface roughness, growth-front roughness, and inter-layer spacings. We explore some fundamental aspects of growth curve shape and their dependence on the x-ray scattering vector and film properties. In particular, the super-periodic modulation of oscillation amplitudes is demonstrated. Oscillations during the growth KCl/NaCl(001) are shown as a typical example of the phenomenon. @FootnoteText@ @footnote 1@E. Weschke, C. Schüssler-Langeheine, R. Meier, and G. Kaindl, Phys. Rev. Lett. 79, 3954 (1997).