AVS 45th International Symposium
    Applied Surface Science Division Thursday Sessions
       Session AS-ThP

Paper AS-ThP6
Identification of Surface Nitrogen Functionalities Using Gas Phase Derivatization and XPS Analysis

Thursday, November 5, 1998, 5:30 pm, Room Hall A

Session: Aspects of Applied Surface Science Poster Session
Presenter: Y. Liu, Eastman Kodak Company
Authors: Y. Liu, Eastman Kodak Company
L.J. Gerenser, Eastman Kodak Company
P.M. Thompson, Eastman Kodak Company
J.M. Grace, Eastman Kodak Company
Correspondent: Click to Email
X-ray photoelectron spectroscopy (XPS) has been widely used as a primary surface analytical technique to determine the surface atomic compositions of polymeric materials. It provides quantitative elemental composition with excellent surface sensitivity. However, quite often, it is very difficult to identify the functional groups when the core-level binding energy shifts of these species are small. We have developed an approach using gas phase derivatization reactions in combination with XPS surface analysis for semi-quantitative determination of nitrogen functional groups. This poster will focus on the studies of two derivatization reagents, trifluoroacetic anhydride and trifluorotolualdehyde, and their applications in the identification of nitrogen functionalities including primary and secondary amines, amides and nitriles.