AVS 66th International Symposium & Exhibition
    Advanced Ion Microscopy and Ion Beam Nano-engineering Focus Topic Thursday Sessions

Session HI-ThP
Advanced Ion Microscopy Poster Session

Thursday, October 24, 2019, 6:30 pm, Room Union Station B

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Click a paper to see the details. Presenters are shown in bold type.

HI-ThP2
Morphology Modification of Si Nanopillars under Ion Irradiation at Elevated Temperatures
Xiaomo Xu, K.-H. Heinig, Helmholtz Zentrum Dresden-Rossendorf, Germany, W. Möller, Helmholtz-Zentrum Dresden-Rossendorf, Germany, H.-J. Engelmann, N. Klingner, Helmholtz Zentrum Dresden-Rossendorf, Germany, A. Gharbi, R. Tiron, CEA-LETI, France, J. von Borany, Helmholtz Zentrum Dresden-Rossendorf, Germany, G. Hlawacek, Helmholtz-Zentrum Dresden Rossendorf, Germany