AVS 66th International Symposium & Exhibition
    Advanced Ion Microscopy and Ion Beam Nano-engineering Focus Topic Thursday Sessions

Session HI+NS-ThA
Emerging Ion Sources, Optics, and Applications

Thursday, October 24, 2019, 2:20 pm, Room B231-232
Moderators: Gregor Hlawacek, Helmholtz-Zentrum Dresden Rossendorf, Germany, Shida Tan, Intel Corporation


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

2:20pm HI+NS-ThA1 Invited Paper
Cold Atom Ion Sources
Jabez McClelland, J.R. Gardner, W.R. McGehee, National Institute of Standards and Technology (NIST), A. Schwarzkopf, B.J. Knuffman, A.V. Steele, zeroK NanoTech Corp.
3:00pm HI+NS-ThA3
Silicon Lithiation by Direct-writing with a Focused Li+-ion Beam
W.R. McGehee, Evgheni Strelcov, V. Oleshko, C. Soles, N.B. Zhitenev, J.J. McClelland, National Institute of Standards and Technology (NIST)
3:20pm HI+NS-ThA4
A New FIB for Deterministic Single Ion Implantation
Nathan Cassidy, UK National Ion Beam Centre, University of Surrey, UK, D. Cox, Advanced Technology Institute, University of Surrey, UK, R. Webb, UK National Ion Beam Centre, University of Surrey, UK, B. Murdin, Advanced Technology Institute, University of Surrey, UK, B. Blenkinsopp, I. Brown, Ionoptika Ltd., UK, R. Curry, The Photon Science Institute, University of Manchester, UK
4:00pm HI+NS-ThA6 Invited Paper
Technology and Applications of a Plasma Ion Source with User-selectable Ion Species
Gregory Schwind, S.M. Kellogg, J. Stiller, M. Doud, C. Rue, B. Van Leer, Thermo Fisher Scientific
4:40pm HI+NS-ThA8
Neutral Helium Microscopy
Bodil Holst, University of Bergen, Norway
5:00pm HI+NS-ThA9
GaBiLi Liquid Metal Alloy Ion Sources for Advanced Nanofabrication
P. Mazarov, T. Richter, L. Bruchhaus, W. Pilz, R. Jede, RAITH GmbH, Germany, Yang Yu, R.M. Schmid, J.E. Sanabia, Raith America, Inc., L. Bischoff, Helmholtz Zentrum Dresden-Rossendorf, Germany, G. Hlawacek, Helmholtz-Zentrum Dresden Rossendorf, Germany
5:20pm HI+NS-ThA10
Focused Ion Beams in Biology: How the Helium Ion Microscope and FIB/SEMs Help Reveal Nature’s Tiniest Structures
Annalena Wolff, Central Analytical Research Facility, Institute for Future Environments, Queensland University of Technology (QUT), Brisbane QLD 4000, Australia, N. Klingner, Helmholtz Zentrum Dresden-Rossendorf, Germany, W. Thompson, HeelionicsLLC, Y. Zhou, Queensland University of Technology (QUT), Australia, J. Lin, Affiliated Stomatological Hospital of Xiamen Medical College, China, Y. Peng, CSIRO Manufacturing, Australia, J. Ramshaw, St. Vincent’s Hospital, University of Melbourne, Australia, Y. Xiao, The Australia-China Centre for Tissue Engineering and Regenerative Medicine (ACCTERM), Queensland University of Technology, Australia