AVS 65th International Symposium & Exhibition


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Advanced Ion Microscopy Focus Topic Sessions

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Start Time Session Code Session Title
Wednesday 2:20pm HI-WeA Novel Beam Induced Material Engineering & Nano-Patterning
Thursday 8:00am HI+AS-ThM Advanced Ion Microscopy & Surface Analysis
Thursday 2:20pm HI-ThA Emerging Ion Sources, Optics, and Applications
Thursday 6:00pm HI-ThP Advanced Ion Microscopy Poster Session

AVS 65th International Symposium & Exhibition