| AVS 65th International Symposium & Exhibition | |
| Advanced Ion Microscopy Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | HI-ThA1 Invited Paper Development of Gas Field Ionization Source using Gas with Low Ionization Energy that Enables Sample Processing and Observation Shinichi Matsubara, H. Shichi, T. Hashizume, Hitachi, Japan |
| 3:00pm | HI-ThA3 Development of Scanning Helium Microscopy (SHeM) Susanne Schulze, D.J. Ward, M. Bergin, S. Lambrick, W. Allison, J. Ellis, A. Jardine, University of Cambridge, UK |
| 3:20pm | HI-ThA4 Fabrication of Trimer/Single Atom Tip for GFIS by Field Evaporation without Tip Heating Kwang-Il Kim, University of Science and Technology, Republic of Korea, Y.H. Kim, T. Ogawa, Korea Research Institute of Standards and Science (KRISS), Republic of Korea, S.J. Choi, Kyungpook National University, Republic of Korea, B. Cho, S.J. Ahn, I.-Y. Park, Korea Research Institute of Standards and Science (KRISS), Republic of Korea |
| 4:40pm | HI-ThA8 Avoiding Amorphization Related Shape Changes of Nano-structures during Medium Fluence Ion Beam Irradiation of Semiconductor Materials Xiaomo Xu, G. Hlawacek, H.-J. Engelmann, K.-H. Heinig, Helmholtz Zentrum Dresden-Rossendorf, Germany, W. Möller, Helmholtz-Zentrum Dresden-Rossendorf, Germany, A. Gharbi, CEA-LETI, France, R. Tiron, CEA-LETI, MINATEC, France, L. Bischoff, T. Prüfer, R. Hübner, S. Facsko, J. von Borany, Helmholtz Zentrum Dresden-Rossendorf, Germany |