AVS 65th International Symposium & Exhibition
Click a session title to see the papers
Start Time | Session Code | Session Title |
---|---|---|
Monday 8:20am | EL+AS+EM-MoM | Application of SE for the Characterization of Thin Films and Nanostructures |
Monday 1:20pm | EL+EM-MoA | Spectroscopic Ellipsometry: Novel Applications and Theoretical Approaches |
Tuesday 6:30pm | EL-TuP | Spectroscopic Ellipsometry Focus Topic Poster Session |
Wednesday 8:00am | PS+AS+EL+EM+SE-WeM | Current and Future Stars of the AVS Symposium I |
Thursday 8:00am | TF+AS+EL+PS-ThM | In-situ Characterization and Modeling of Thin Film Processes |
Thursday 2:20pm | TF+AS+EL+EM+NS+PS+SS-ThA | IoT Session: Thin Films for Flexible Electronics and IoT |