AVS 65th International Symposium & Exhibition


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Spectroscopic Ellipsometry Focus Topic Sessions

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Start Time Session Code Session Title
Monday 8:20am EL+AS+EM-MoM Application of SE for the Characterization of Thin Films and Nanostructures
Monday 1:20pm EL+EM-MoA Spectroscopic Ellipsometry: Novel Applications and Theoretical Approaches
Tuesday 6:30pm EL-TuP Spectroscopic Ellipsometry Focus Topic Poster Session
Wednesday 8:00am PS+AS+EL+EM+SE-WeM Current and Future Stars of the AVS Symposium I
Thursday 8:00am TF+AS+EL+PS-ThM In-situ Characterization and Modeling of Thin Film Processes
Thursday 2:20pm TF+AS+EL+EM+NS+PS+SS-ThA IoT Session: Thin Films for Flexible Electronics and IoT

AVS 65th International Symposium & Exhibition