| AVS 65th International Symposium & Exhibition | |
| Spectroscopic Ellipsometry Focus Topic | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| EL-TuP1 An In situ Spectroscopic Ellipsometry Study of Cerium Oxidation Wayne Lake, P. Roussel, AWE, UK |
| EL-TuP2 In-situ Multi-wavelength Ellipsometric Monitoring of the Reactive Sputter Deposition of WOx Films Ned Ianno, G. Kaufman, C. Luth, University of Nebraska-Lincoln, C. Exstrom, S.A. Darveau, University of Nebraska at Kearney, B. Johs, Film Sense |
| EL-TuP3 Mid-infrared Optical Constants of InAsSb Alloys and Bulk GaSb Pablo Paradis, S. Zollner, R. Carrasco, New Mexico State University, Department of Physics, J. Carlin, V. Dahiya, A. Kazemi, S. Krishna, The Ohio State University, Department of Electrical and Computer Engineering |
| EL-TuP4 Temperature-dependent Ellipsometry and Thermal Stability of Ge2Sb2Te5:C Phase Change Memory Alloys Cesy Zamarripa, N. Samarasingha, F. Abadizaman, R. Carrasco, S. Zollner, New Mexico State University |