| AVS 59th Annual International Symposium and Exhibition | |
| Scanning Probe Microscopy Focus Topic | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | SP+AS+BI+ET+MI+NM+NS+SS+TF-WeM2 Invited Paper Controlled Coupling of Silicon Atomic Quantum Dots at Room Temperature: A Basis for Atomic Electronics? R.A. Wolkow, University of Alberta and The National Institute for Nanotechnology, Canada, J. Pitters, The National Institute for Nanotechnology, Canada, G. DiLabio, M. Taucer, P. Piva, L. Livadaru, University of Alberta and The National Institute for Nanotechnology, Canada |
| 9:00am | SP+AS+BI+ET+MI+NM+NS+SS+TF-WeM4 Atomic Forces and Energy Dissipation of a Bi-Stable Molecular Junction C. Lotze, Freie Universtiät Berlin, Germany, M. Corso, K.J. Franke, F.V. Oppen, J.I. Pascual, Freie Universität Berlin, Germany |
| 9:20am | SP+AS+BI+ET+MI+NM+NS+SS+TF-WeM5 Acetylene on Cu(111): Imaging a Molecular Pattern with a Constantly Rearranging Tip Y. Zhu, J. Wyrick, K.D. Cohen, K. Magnone, C. Holzke, D. Salib, Q. Ma, D.Z. Sun, L. Bartels, University of California Riverside |
| 9:40am | SP+AS+BI+ET+MI+NM+NS+SS+TF-WeM6 Atomic Scale Imaging and Electronic Structure of Trimethylaluminum Deposition on III-V Semiconductor (110) Surfaces T.J. Kent, M. Edmonds, E. Chagarov, A.C. Kummel, University of California San Diego |
| 10:40am | SP+AS+BI+ET+MI+NM+NS+SS+TF-WeM9 A New Experimental Method to Determine the Torsional Spring Constants of Microcantilevers G. Haehner, J.D. Parkin, University of St Andrews, UK |
| 11:00am | SP+AS+BI+ET+MI+NM+NS+SS+TF-WeM10 A Torsional Device for Easy, Accurate and Traceable Force Calibration of AFM Cantilevers J.F. Portoles, P.J. Cumpson, Newcastle University, UK |
| 11:20am | SP+AS+BI+ET+MI+NM+NS+SS+TF-WeM11 Invited Paper Nanoscale Surface Assembly by Single-Molecule Cut-and-Paste H.E. Gaub, Ludwig-Maximilians Universitat, Germany |