AVS 59th Annual International Symposium and Exhibition | |
Scanning Probe Microscopy Focus Topic | Wednesday Sessions |
Session SP+AS+BI+ET+MI+NM+NS+SS+TF-WeM |
Session: | Probe-Sample Interactions, Nano-Manipulation and Fabrication |
Presenter: | H.E. Gaub, Ludwig-Maximilians Universitat, Germany |
Correspondent: | Click to Email |