AVS 59th Annual International Symposium and Exhibition
    Scanning Probe Microscopy Focus Topic Wednesday Sessions
       Session SP+AS+BI+ET+MI+NM+NS+SS+TF-WeM

Paper SP+AS+BI+ET+MI+NM+NS+SS+TF-WeM9
A New Experimental Method to Determine the Torsional Spring Constants of Microcantilevers

Wednesday, October 31, 2012, 10:40 am, Room 16

Session: Probe-Sample Interactions, Nano-Manipulation and Fabrication
Presenter: G. Haehner, University of St Andrews, UK
Authors: G. Haehner, University of St Andrews, UK
J.D. Parkin, University of St Andrews, UK
Correspondent: Click to Email

Cantilever based technologies have seen an ever increasing level of interest since the atomic force microscope (AFM) was introduced more than two decades ago. Recent developments employ microcantilevers as stand-alone sensors by exploiting the dependence of their oscillating properties on external parameters such as adsorbed mass [1], or the density and the viscosity of a liquid environment [2,3]. They are also a key part in many microelectromechanical systems (MEMS) [4]. In order to quantify measurements performed with microcantilevers their stiffness or spring constants have to be known. Following calibration of the spring constants a change in oscillation behavior can be quantitatively related to physical parameters that are probed. The torsional modes of oscillation have attracted significant attention due to their high sensitivity towards lateral and friction forces, and recent developments in torsional-tapping AFM technology [5]. However, the methods available to determine the torsional spring constants experimentally are in general not simple, not very reliable, or risk damage to the cantilever [6].
We demonstrate a new method to determine the spring constants of the torsional modes of microcantilevers experimentally with high accuracy and precision. The method is fast, non-destructive and non-invasive. It is based on measuring the change in the resonance frequencies of the torsional modes as a function of the fluid flow escaping from a microchannel. Results for rectangular cantilevers will be presented and compared to results obtained with other methods [7].
[1] J. D. Parkin and G. Hähner, Rev. Sci. Instrum. 82 (3), 035108 (2011).
[2] N. McLoughlin, S. L. Lee, and G. Hähner, Appl. Phys. Lett. 89 (18), 184106 (2006).
[3] N. McLoughlin, S. L. Lee, and G. Hähner, Lab Chip , 1057 (2007).
[4] S. Beeby, G. Ensell, N. Kraft, and N. White, MEMS Mechanical Sensors. (Artech House London, 2004).
[5] O. Sahin and N. Erina, Nanotechnology 19 (44), 445717 (2008).
[6] M. Munz, Journal of Physics D-Applied Physics 43 (6), 063001 (2010).
[7] C. P. Green, H. Lioe, J. P. Cleveland, R. Proksch, P. Mulvaney, and J. E. Sader, Rev. Sci. Instrum. 75 (6), 1988 (2004).