| AVS 59th Annual International Symposium and Exhibition | |
| Spectroscopic Ellipsometry Focus Topic | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | EL+TF+BI+AS+EM+SS-MoA1 Biochemical Optical Sensors Based on Highly-Ordered Slanted Columnar Thin Films D. Schmidt, K.B. Rodenhausen, University of Nebraska-Lincoln, J. VanDerslice, T.E. Tiwald, J.A. Woollam Co., Inc., E. Schubert, M. Schubert, University of Nebraska-Lincoln |
| 2:20pm | EL+TF+BI+AS+EM+SS-MoA2 Studies of Optical Properties of Hybrid J-aggregates and Nanocrystal Quantum Dots Layers for Photonic Applications K. Roodenko, H.M. Nguyen, L. Caillard, A. Radja, O. Seitz, Yu.N. Gartstein, A.V. Malko, Y.J. Chabal, The University of Texas at Dallas |
| 2:40pm | EL+TF+BI+AS+EM+SS-MoA3 Invited Paper Love and Death, the Story of Most Proteins and Most Surfaces as Told by Spectroscopic Ellipsometry T. Benavidez, K. Chumbuni-Torres, J.L. Felhofer, C.D. Garcia, The University of Texas at San Antonio |
| 3:40pm | EL+TF+BI+AS+EM+SS-MoA6 Invited Paper Detailed Photoresist and Photoresist Processing Studies using Spectroscopic Ellipsometry C. Henderson, Georgia Institute of Technology |
| 4:20pm | EL+TF+BI+AS+EM+SS-MoA8 Ellipsometric Characterization of a Thin Titaniumoxide Nanosheets Layer H. Wormeester, G. Maidecchi, S. Kumar, A. Kumar, A. ten Elshof, H.J.W. Zandvliet, MESA+ Institute for Nanotechnology, University of Twente, The Netherlands |
| 4:40pm | EL+TF+BI+AS+EM+SS-MoA9 Preparation of Abrupt LaAlO3 Surfaces Monitored by Spectroscopic Ellipsometry C.M. Nelson, M. Spies, L.S. Abdallah, S. Zollner, Y. Xu, H. Luo, New Mexico State University |
| 5:00pm | EL+TF+BI+AS+EM+SS-MoA10 Determination of the Refractive Index of a Gold-Oxide Thin Film Using X-Ray Photoelectron Spectroscopy and Spectroscopic Ellipsometry K. Cook, G.S. Ferguson, Lehigh University |