AVS 59th Annual International Symposium and Exhibition | |
Spectroscopic Ellipsometry Focus Topic | Monday Sessions |
Session EL+TF+BI+AS+EM+SS-MoA |
Session: | Spectroscopic Ellipsometry: From Organic and Biological Systems to Inorganic Thin Films |
Presenter: | H. Wormeester, MESA+ Institute for Nanotechnology, University of Twente, The Netherlands |
Authors: | H. Wormeester, MESA+ Institute for Nanotechnology, University of Twente, The Netherlands G. Maidecchi, MESA+ Institute for Nanotechnology, University of Twente, The Netherlands S. Kumar, MESA+ Institute for Nanotechnology, University of Twente, The Netherlands A. Kumar, MESA+ Institute for Nanotechnology, University of Twente, The Netherlands A. ten Elshof, MESA+ Institute for Nanotechnology, University of Twente, The Netherlands H.J.W. Zandvliet, MESA+ Institute for Nanotechnology, University of Twente, The Netherlands |
Correspondent: | Click to Email |
The photochemical properties of titaniumoxide make this a widely studied material. Of special interest is a thin nanostructured layer of such a material. A variety of a nanostructured material is the single sheet titaniumoxide that can be obtained by delaminating a layered titanate, with stochiometry Ti1-xO2-4x (x=0.0875). The slight titanium deficiency leads to a negatively charged nanosheet that can be used as a building block in a layer by layer assembled composite film [1]. In this work we used Langmuir Blodget to deposit succesive thin layers of nanosheets. The electronic properties of these layers were investigated with ellipsometry and Scanning Tunneling Microscopy (STM). The optical spectra show the well known absoprtion peak at 4.6 eV for titaniumoxide nanosheets. The optical spectra can be well modeled with a Cody-Lorentz dielectric function profile providing a bandgap of … eV, a value also found from STM IV spectroscopy. The Cody-Lorentz profile also indicates a slight below band gap light absorption by the nanosheet material.
[1] T. Sasaki, Y. Ebina, T. Tanaka, M. Harada, M. Watanabe and G. Decher, Chem. Mater. 2001, 13, 4661