| Room |
WeM
Wednesday, 11/2/11, 8:00am |
WeL
Wednesday, 11/2/11, 12:00pm |
WeA
Wednesday, 11/2/11, 2:00pm |
| 102 |
AS+BI+NS-WeM
Advances in Scanning Probe Microscopy |
|
AS-WeA
Correlative Analysis - A Multi-technique Approach for Identification and Structure-Property Relationships |
| 103 |
EN+EM+NS-WeM
Quantum Dot and Nanowire Solar Cells |
|
EN1+TF-WeA
Thin Film Chalcogenide Solar Cells (CIGS, CZTS, CdTe and Related Materials) |
| 104 |
SE+SS-WeM
Surface Engineering for Thermal Management |
|
SE+PS-WeA
Atmospheric Pressure Plasmas |
| 105 |
MI-WeM
Fundamental Problems in Magnetism |
|
MI-WeA
Spintronics, Magnetoelectronics, Multiferroics, and Dilute Magnetic Semiconductor Applications |
| 106 |
HI+AS+BI+NS-WeM
Nano- and Bio- Imaging with Helium Ion Microscopy |
|
EN2+TF-WeA
Thin Films for Solar Fuels |
| 107 |
SS1-WeM
Atomistic Control of Structure & Evolution |
|
SS-WeA
Adsorption & Reactions on Oxide Surfaces |
| 108 |
BI-WeM
Cells at Interfaces |
|
BI+AS+NS+SS-WeA
Functionalization and Characterization of Nanostructures |
| 109 |
SS2-WeM
Chemisorption on Metal & Oxide Nanoparticles |
|
TF1+EM-WeA
Nonvolatile Memory |
| 110 |
TF1+EM-WeM
ALD/MLD: Hybrid Organic Films |
|
TF2+EM-WeA
Nanostructuring Thin Films |
| 111 |
NM+AS+MS-WeM
Nanomanufacturing Issues: Metrology and Environmental Concerns |
|
TR-WeA
Emerging Interfaces of Tribological Importance |
| 201 |
PS+SE-WeM
Atmospheric Plasma Processing and Micro Plasmas |
|
PS-WeA
Plasma Sources |
| 202 |
PS+SS-WeM
Plasma Surface Interactions (Fundamentals & Applications) I |
|
PS+EM-WeA
Low-K Materials & Integration |
| 203 |
NS-WeM
Carbon-Based Nanomaterials |
|
|
| 207 |
NT+AS+MI-WeM
Applications of Neutron Scattering I |
|
NT+AS-WeA
Applications of Neutron Scattering II |
| 208 |
GR+MN-WeM
Graphene: Mechanical and Thermal Properties, Graphene MEMS and NEMS |
|
GR-WeA
Graphene Characterization including Microscopy and Spectroscopy |
| 209 |
EN+NS-WeM
Organic Photovoltaics |
|
AC+MI-WeA
Magnetic and Electron Correlation Effects in Actinides and Rare Earths |
| 210 |
EM-WeM
Low-k Materials and Devices |
|
EM-WeA
Defects in Electronic Materials |
| West Exhibit Hall |
EW-WeM
Exhibitor Technology Spotlight |
EW-WeL
Exhibitor Technology Spotlight |
|