AVS 52nd International Symposium
    Exhibitor Workshop Wednesday Sessions

Session EW-WeL
XPS and SPM New Developments and Applications

Wednesday, November 2, 2005, 12:00 pm, Room Exhibit Hall C&D
Moderator: C. Bryson, Apparati, Inc.

  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

12:00pm EW-WeL1
Improvement of the Quantification from XPS Data Using Predetermined Spectrometer-Transmission Functions with UNIFIT 2004
R. Hesse, P. Streubel, R. Szargan, University of Leipzig, Germany
12:40pm EW-WeL3
Latest Development  in Environmental Scanning Probe Microscope - Membrane of a HELA Cancer Cell
S. Xu, C. Wall, Molecular Imaging Corp.
1:00pm EW-WeL4
Dynamic Scaling during Shadowing Growth of Ru Nanorods
L. Li, F. Tang, T. Karabacak, G.-C. Wang, T.-M. Lu, Rensselaer Polytechnic Institute
1:20pm EW-WeL5
A New Approach to SPM Control Electronics
M. Maier, B. Uder, Omicron NanoTechnology, Germany