| AVS 50th International Symposium | |
| QSA-10 Topical Conference | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| QS-TuP1 Test Studies on Charging, Charge Compensation and XPS Binding Energy Referencing for Al-Ox on Al and SiO@sub 2@ M.H. Engelhard, D.R. Baer, D.H. Kim, D.J. Gaspar, Pacific Northwest National Laboratory |
| QS-TuP2 A Multi-modal Imaging and Visualization System for 3-D Materials Characterization J.E. Fulghum, K. Artyushkova, J. Farrar, University of New Mexico, L. Broadwater, Kent State University, J. Fenton, S. Pylypenko, D. Barbash, University of New Mexico |
| QS-TuP3 Measurement of Overlayer Properties Using Angle Resolved XPS P. Mack, B. McIntosh, R.G. White, J. Wolstenholme, Thermo Electron |
| QS-TuP4 Experimental Determinations of Electron Inelastic Mean Free Paths in Ten Elemental Solids from Elastic Peak Intensities S. Tanuma, T. Kimura, National Institute for Materials Science, Japan, K. Goto, Nagoya Institute of Technology, Japan, S. Ichimura, National Institute for Advanced Industral Science, Japan |
| QS-TuP6 An Analysis of Rotating-Compensator Ellipsometers for Metrology D.E. Aspnes, M. Asar, North Carolina State University, T. Mori, Tohoku University, Japan, K.A. Ebert, Thermawave, Inc. |
| QS-TuP7 Characterization of Buried Nanowire by X-ray Standing Wave Method A. Saito, Osaka University and RIKEN harima Institute, Japan, K. Matoba, J. Maruyama, Osaka University, Japan, W. Yashiro, National Institute of Advanced Industrial Science and Technology, Japan, T. Ohashi, H. Takaki, K. Takami, M. Akai-Kasaya, Y. Kuwahara, Osaka University, Japan, Y. Yoda, O. Sakata, Japan Synchrotron Radiation Research Institute, K. Miki, National Institute for Materials Science, Japan, M. Aono, Osaka University, Japan |
| QS-TuP8 Phase Separation at the Surface of PLLA/P104 Blends J. Yu, J.A. Gardella, State University of New York at Buffalo |
| QS-TuP9 Factors Influencing Angle Dependent XPS to Si Oxide Films N. Sanada, A. Tanaka, A. Yamamoto, ULVAC-PHI, Inc., Japan |
| QS-TuP10 Comparison of Model Predictions and Experimental Measurements of Linescans Across an Interface by Auger Electron Spectroscopy S.A. Wight, C.J. Powell, National Institute of Standards and Technology |
| QS-TuP11 Quantitative Image Analysis of Low-energy Electron Diffraction Patterns to Obtain Surface Geometries of Amines Adsorbed on the Si(100)-(2x1) Surface J.K. Dogbe, S.M. Casey, University of Nevada, Reno |
| QS-TuP12 Physically Measuring Thickness' of Thin Films via Atomic Force Microscopy: Design and Use of The Abruptor G. Acosta, D. Allred, R. Davis, Brigham Young University |