AVS 46th International Symposium
    Thin Films Division Monday Sessions

Session TF-MoP
Poster Session

Monday, October 25, 1999, 5:30 pm, Room 4C


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

TF-MoP1
Effect of HCl Catalyst in the Formation of Flat Structures of Ta@sub 2@O@sub 5@ Thin Films by Sol-Gel Technique
S. Santucci, C. Cantalini, A.R. Phani, University of L'Aquila, Italy
TF-MoP2
Mechanical Properties and Residual Stresses in AlN Films Prepared by Ion Beam Assisted Deposition
Y. Watanabe, N. Kitazawa, Y. Nakamura, National Defense Academy, Japan, C. Li, T. Sekino, K. Niihara, Osaka University, Japan
TF-MoP3
The Effects of Temperature and Morphology on the Electron Stimulated Desorption of H@super -@ from Thin Hydrocarbon Films
A.D. Bass, L. Parenteau, F. Weik, L. Sanche, University of Sherbrooke, Canada
TF-MoP4
Oxidation Studies and Chemical State Analysis of Polycrystalline Magnetron Sputtered (Ti,Al)N Films
A. Kale, S. Seal, S. Sundaram, University of Central Florida
TF-MoP5
Characterization of VO@sub 2@ Epitaxial Films with Different Orientations Grown on Sapphire (110) by Sputtering
P. Jin, S. Tanemura, National Industrial Research Institute of Nagoya, Japan, K. Macak, U. Helmersson, Linkoping University, Sweden
TF-MoP6
Towards a Fully Monitored Fourier Transform Infrared Spectroscopic Ellipsometer
J.C. Cigal, G.M.W. Kroesen, Eindhoven University of Technology, The Netherlands
TF-MoP7
Improved Light Stability of Colored SiO@sub 2@ Coatings Containing Organic and Metalorganic Dye Molecules
L.L. Diaz-Flores, Inst. Tecnologico de Saltillo, Mexico, J.J. Perez-Bueno, Univ. Autonoma de Queretaro, Mexico, F.J. Espinoza-Beltran, R. Ramirez-Bon, Y.V. Vorobiev, J. Gonzalez-Hernandez, CINVESTAV-IPN, Mexico
TF-MoP8
Diamond Formation Using a Low-Pressure Inductively Coupled Plasma
H. Ito, Nagoya Municipal Industrial Research Institute, Japan, K. Teii, Nagoya University, Japan, M. Ito, Wakayama University, Japan, M. Hori, Nagoya University, Japan, T. Takeo, Nagoya Municipal Industrial Research Institute, Japan, T. Goto, Nagoya University, Japan
TF-MoP9
Microstructure of Ti:D Films Prepared by Reactively rf Sputtering
S. Nakao, P. Jin, K Saitoh, Y. Miyagawa, S. Miyagawa, National Industrial Research Institute of Nagoya, Japan
TF-MoP10
Growth of Si Thin Films on CeO@sub 2@/Si(111) Substrate Prepared by Electron Beam Evaporation
C.G. Kim, J.H. Yang, B.S. Moon, C.Y. Park, Sung Kyun Kwan University, Korea
TF-MoP11
Origin of Electrical Property Distribution on Surface of ZnO:Al Films Prepared by Magnetron Sputtering
T. Minami, T. Miyata, T. Yamamoto, T. Nishitani, Kanazawa Institute of Technology, Japan
TF-MoP12
Effect of C@sub 2@ Radicals on Diamond Growth Using Low-Pressure, Radio Frequency, CH@sub 3@OH/H@sub 2@/H@sub 2@O Inductively Coupled Plasma
T. Shiomi, H. Nagai, M. Hiramatsu, M. Nawata, Meijo University, Japan
TF-MoP13
Properties of Indium Oxide Thin Films Prepared by Reactive Electron Beam Evaporation Technique for EMI Control
J. Asbalter, A. Subrahmanyam, Indian Institute of Technology, India
TF-MoP14
Diffusion of Cu from PVD Al-Cu Alloy and CVD Cu Thin Films into CVD Al Thin Films Inside Submicron Via Holes
B. Rogers, Vanderbilt University
TF-MoP15
Process Control and Properties of Aluminum Doped Zinc Oxide Films Deposited by High Rate Mid-frequency Reactive Magnetron Sputtering
N. Malkomes, M. Vergöhl, B. Szyszka, T. Matthée, Fraunhofer Institute for Surface Engineering and Thin Films, Germany
TF-MoP16
Low-temperature Growth of Ti(C,N) Thin Films on D2 Steel and Si(100) Substrates by PEMOCVD
B.-C. Kang, J.-H. Boo, Y.K. Cho, J.-G. Han, C.H. Heo, SungKyunKwan University, Korea
TF-MoP17
A Study on the Characteristics of TiN Thin Film Deposited by Atomic Layer Chemical Vapor Deposition Method
H. Jeon, J.W. Lee, J.H. Koo, Y.S. Kim, Y.D. Kim, D.S. Kim, Hanyang University, Korea
TF-MoP18
Non-Stoichiometric PMN-PT Films Grown by Laser Ablation
A. Fundora, Universidad de la Habana, Cuba, J.M. Siqueiros, UNAM, Mexico, J. Portelles, Universidad de la Habana, Cuba
TF-MoP19
The Advancing Techniques and Sputtering Effects of Oxide Films Fabricated by Stationary Plasma Thruster with Argon and Oxygen Gases
J. Cho, KIST, Korea, Y. Ermakov, Mirea, Russia, K.H. Yoon, Yonsei University, Korea, S.K. Koh, KIST, Korea
TF-MoP20
An Alternative Procedure for the Deposition of Close-Spaced Sublimation CdTe/CdS Solar Cells
H.R. Moutinho, R.G. Dhere, M.M. Al-Jassim, C. Ballif, L.L. Kazmerski, National Renewable Energy Laboratory
TF-MoP21
CdS/CdTe Interface Analysis by Transmission Electron Microscopy
R.G. Dhere, M.M. Al-Jassim, K.M. Jones, H.R. Moutinho, T.A. Gessert, L.L. Kazmerski, National Renewable Energy Laboratory
TF-MoP22
In-Plane Texturing in Evaporated Cr Films
J.F. Whitacre, University of Michigan, Z.U. Rek, Stanford Synchrotron Radiation Laboratory, J.C. Bilello, S.M. Yalisove, University of Michigan
TF-MoP23
Sputter Deposition of Ni Thin Films For Nickel Silicide Metallization
H. Zhang, Tosoh SMD, Inc.
TF-MoP24
Synthesis of Highly Oriented Piezoelectric AlN Films by Reactive Sputter Deposition
F. Engelmark, G. Fuentes, I.V. Katardjiev, A. Harsta, U. Smith, S. Berg, Uppsala University, Sweden
TF-MoP25
Surface Morphology Analysis in Correlation with Crystallinity of CeO@sub 2@(110) Layers on Si(100) Substrates
T. Inoue, T. Nakamura, S. Nihei, Iwaki Meisei University, Japan, Y. Yamamoto, Hosei University, Japan
TF-MoP26
Oxide Thin Films for Electroluminescent Phosphors
J.S. Lewis, P.H. Holloway, University of Florida
TF-MoP27
XPS and AES Investigation on the Oxidation Resistance of Plasma-treated Copper Leadframe
A. Wong, Nanyang Technological University, Singapore, R.G. Krishnan, Institute of Microelectronics, Singapore, G. Sarkar, Nanyang Technological University, Singapore
TF-MoP29
Optimization of the Reflectivity of Magnetron Sputter Deposited Silver Films
M. Vergöhl, N. Malkomes, B. Szyszka, F. Neumann, T. Matthée, Fraunhofer Institute for Surface Engineering and Thin Films, Germany, G. Bräuer, Leybold Systems GmbH, Germany
TF-MoP30
Preparation and Characterization of RF-sputtered SrTiO@sub 3@ Thin Films
K. Radhakrishnan, C.L. Tan, H.Q. Zheng, G.I. Ng, Nanyang Technological University, Singapore