| AVS 46th International Symposium | |
| Electronic Materials and Processing Division | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | EM+NS-WeM1 Homoepitaxy on AlSb(001): Novel Reconstructions and Their Implications for Nucleation and Growth W. Barvosa-Carter, HRL Laboratories, A.S. Bracker, J.C. Culbertson, B.V. Shanabrook, B.R. Bennett, L.J. Whitman, Naval Research Laboratory, N. Modine, Sandia National Laboratories, H. Kim, E. Kaxiras, Harvard University |
| 8:40am | EM+NS-WeM2 A New Point Projection Microscope for the Holographic Imaging of Single Macromolecules A. Eisele, B. Völkel, A. Glenz, B. Jäger, A. Gölzhäuser, M. Grunze, Universität Heidelberg, Germany |
| 9:00am | EM+NS-WeM3 Invited Paper Single Molecule Vibrational Spectroscopy with a Variable Temperature STM L.J. Lauhon, W. Ho, Cornell University |
| 9:40am | EM+NS-WeM5 Invited Paper Characterization of Electronic Materials and Devices by Scanning Probe Microscopies C.C. Williams, V. Zavyalov, L. Klein, University of Utah, J. Kim, Korea Advanced Institute of Science and Technology |
| 10:20am | EM+NS-WeM7 Invited Paper Mapping Composition and Electrostatic Potential in Devices A. Ourmazd, A. Orchowski, W.-D. Rau, P. Schwander, IHP, Germany |
| 11:00am | EM+NS-WeM9 Failure Analysis of Sub 1/4-Micron Contacts by Means of TEM-EELS F. Yano, Y. Nakamura, T. Aoyama, Y. Mitsui, Hitachi Ltd., Japan |
| 11:20am | EM+NS-WeM10 Applications of AFM/SCM in Imaging Implant Structures of Semiconductor Devices K.-J. Chao, J.R. Kingsley, R.J. Plano, X. Lu, I.D. Ward, Charles Evans & Associates |
| 11:40am | EM+NS-WeM11 Capacitance Measurements on Gold Nanowires A. Wlasenko, McGill University, Canada |