AVS 46th International Symposium
    Electronic Materials and Processing Division Wednesday Sessions
       Session EM+NS-WeM

Paper EM+NS-WeM2
A New Point Projection Microscope for the Holographic Imaging of Single Macromolecules

Wednesday, October 27, 1999, 8:40 am, Room 6C

Session: Nano-characterization of Molecules, Materials, and Devices
Presenter: A. Eisele, Universität Heidelberg, Germany
Authors: A. Eisele, Universität Heidelberg, Germany
B. Völkel, Universität Heidelberg, Germany
A. Glenz, Universität Heidelberg, Germany
B. Jäger, Universität Heidelberg, Germany
A. Gölzhäuser, Universität Heidelberg, Germany
M. Grunze, Universität Heidelberg, Germany
Correspondent: Click to Email
In Low Energy Electron Point Source microscopy the spatial coherence of electrons from point sources can be utilized to image single molecules. A molecular object is positioned ~100 nm in front of the source and interference patterns between the part of the electron's wave function that scatters at the object and the part that passes by unscattered are recorded.@footnote 1@ Structural information on the molecule can then be obtained by numerical reconstruction of the hologram.@footnote 2,3@ We have built a new microscope for the recording of holograms at high magnification (@>=@10@super 6@) and under the minimization of critical disturbances like vibrations and alternating magnetic fields. In the presented instrument projection microscopy can be interleaved with in-situ preparation of the source via field emission / field ion microscopy. The microscope has been tested by the imaging of single DNA molecules that were deposited on thin structured siliconmembranes. Numerical reconstructions of the obtained holograms show corrugated strands with a diameter of ~2 nm. @FootnoteText@ @footnote 1@ H.-W. Fink, W. Stocker, and H. Schmid, Phys. Rev. Lett. 65, 1204 (1990) @footnote 2@ H. J. Kreuzer, K. Nakumura, A. Wiezbicki, H.-W. Fink, and H. Schmid, Ultramicroscopy 45, 381 (1992) @footnote 3@ A. Gölzhäuser, B. Völkel, B. Jäger, M. Zharnikov, H.J. Kreuzer, M. Grunze, J. Vac. Sci. Technol. A16(5), 3025 (1998)