| AVS 46th International Symposium | |
| Electronic Materials and Processing Division | Wednesday Sessions |
| Session EM+NS-WeM |
| Session: | Nano-characterization of Molecules, Materials, and Devices |
| Presenter: | L.J. Lauhon, Cornell University |
| Authors: | L.J. Lauhon, Cornell University W. Ho, Cornell University |
| Correspondent: | Click to Email |