| AVS 45th International Symposium | |
| Thin Films Division | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | TF-TuA1 Real Time Ellipsometry Study the Deposition of Barium Strontium Titanate Thin Films Y. Gao, A. Mueller, E.A. Irene, University of North Carolina, Chapel Hill, O. Auciello, A.R. Krauss, Argonne National Laboratory |
| 2:20pm | TF-TuA2 Optical Constants of Crystalline WO@sub 3@ Deposited by Magnetron Sputterting M.J. DeVries, C. Trimble, T.E. Tiwald, D.W. Thompson, J.A. Woollam, University of Nebraska, Lincoln, J.S. Hale, J. A. Woollam Co., Inc. |
| 3:00pm | TF-TuA4 Ordered Binary Oxide Films: V@sub 2@O@sub 3@ (0001)/Al@sub 2@O@sub 3@/Mo(110) Q. Guo, D.Y. Kim, S.C. Street, D.W. Goodman, Texas A&M University |
| 3:20pm | TF-TuA5 Invited Paper In-Situ Thin Film Characterization J.M. Gibson, University of Illinois, Urbana |
| 4:20pm | TF-TuA8 Direct Three-Dimensional Characterization of Buried Interface Morphology with Quantized Electron Waves I.B. Altfeder, D.M. Chen, The Rowland Institute for Science |
| 4:40pm | TF-TuA9 A Novel Design of a Reflecton Analyzer for Elemental and Isotopic Analysis by MSRI (Mass Spectroscopy of Recoil Ions)@footnote 1@ K.L. Waters, K. Baudin, J.A. Schultz, Ionwerks |
| 5:00pm | TF-TuA10 The Interaction of Al Atoms with Surface-Bound Organic Functional Groups Studied by In-situ XPS, Infrared Spectroscopy and ToF-SIMS A.E. Hooper, G.L. Fisher, Pennsylvania State University, R.L. Opila, Bell Laboratories, Lucent Technologies, N. Winograd, D.L. Allara, Pennsylvania State University |