AVS 45th International Symposium
    Thin Films Division Tuesday Sessions
       Session TF-TuA

Paper TF-TuA4
Ordered Binary Oxide Films: V@sub 2@O@sub 3@ (0001)/Al@sub 2@O@sub 3@/Mo(110)

Tuesday, November 3, 1998, 3:00 pm, Room 310

Session: In-situ Characterization of Thin Films
Presenter: Q. Guo, Texas A&M University
Authors: Q. Guo, Texas A&M University
D.Y. Kim, Texas A&M University
S.C. Street, Texas A&M University
D.W. Goodman, Texas A&M University
Correspondent: Click to Email
Ordered binary oxide films, vanadium oxide on aluminum oxide, on the (110) molybdenum surface have been prepared in ultra-high vacuum conditions and characterized by various surface analytical techniques. Results from Auger electron spectroscopy, low energy electron diffraction, high-resolution electron loss spectroscopy, X-ray photoelectron spectroscopy and ion scattering spectroscopy indicated that the vanadia films grew on the Al@sub 2@O@sub 3@/Mo(110) surface epitaxially as V@sub 2@O@sub 3@(0001). Results from electronic structure measurements show an increase in energy of the a@sub 1g@ level in the 3d band at 100 K, which is one possible contributor to the metal-insulator transition in V@sub 2@O@sub 3@.