AVS 64th International Symposium & Exhibition


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Advanced Ion Microscopy Focus Topic Sessions

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Start Time Session Code Session Title
Wednesday 2:20pm HI-WeA Emerging Ion Sources and Optics
Wednesday 2:20pm TR+AS+HI+NS+SS-WeA Molecular Origins of Friction
Thursday 8:00am HI+BI+NS+TR-ThM Advanced Ion Microscopy Applications
Thursday 2:20pm HI+NS+TR-ThA Novel Beam Induced Surface Analysis and Nano-Patterning
Thursday 6:30pm HI-ThP Advances in Ion Microscopy Poster Session

AVS 64th International Symposium & Exhibition