| AVS 64th International Symposium & Exhibition | |
| Advanced Ion Microscopy Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | HI+NS+TR-ThA1 Invited Paper Multimodal Chemical Imaging of Nanoscale Interfacial Phenomena on a Combined HIM-SIMS Platform Olga Ovchinnikova, Oak Ridge National Laboratory |
| 3:00pm | HI+NS+TR-ThA3 Characterizing Surface Immobilized Antibodies using ToF-SIMS and Multivariate Analysis N.G. Welch, CSIRO Manufacturing, Australia, R.M.T. Madiona, La Trobe University, Australia, J.A. Scoble, B.W. Muir, CSIRO Manufacturing, Australia, Paul Pigram, La Trobe University, Australia |
| 4:00pm | HI+NS+TR-ThA6 Invited Paper Single-nanometer Functional Graphene Devices Patterned with Helium Ion Beam Hiroshi Mizuta, M.E. Schmidt, T. Kanzaki, Japan Advanced Institute of Science and Technology (JAIST), Japan, S. Ogawa, National Institute of Advanced Industrial Science and Technology (AIST), Japan, M. Muruganathan, Japan Advanced Institute of Science and Technology (JAIST), Japan |
| 5:00pm | HI+NS+TR-ThA9 Monte Carlo Simulation Study of Gas Assisted Focused Ion Beam Induced Etching Kyle Mahady, P.D. Rack, University of Tennessee, S. Tan, Intel Corporation, Y. Greenzweig, Intel Corporation, Israel, R.H. Livengood, Intel Corporation, A. Raveh, Intel Corporation, Israel |
| 5:20pm | HI+NS+TR-ThA10 Direct Write of Complex 3-Dimensional Structures with Helium Ion Microscopy Matthew Burch, A.V. Ievlev, Oak Ridge National Laboratory, M.G. Stanford, B. Lewis, University of Tennessee, X. Sang, S. Kim, J. Fowlkes, Oak Ridge National Laboratory, P.D. Rack, University of Tennessee, R.R. Unocic, A. Belianinov, O.S. Ovchinikova, Oak Ridge National Laboratory |