| AVS 64th International Symposium & Exhibition | |
| Advanced Ion Microscopy Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | HI+BI+NS+TR-ThM1 Invited Paper Scanning Helium Atom Microscopy: Imaging with a Deft Touch Paul Dastoor, University of Newcastle, Australia |
| 8:40am | HI+BI+NS+TR-ThM3 Biofilm Structure of Geobacter Sulfurreducens by Helium Ion Microscopy Alex Belianinov, Oak Ridge National Laboratory, M. Halsted, M.J. Burch, Oak Ridge National Laboratory, S. Kim, S. Retterer, Oak Ridge National Laboratory |
| 9:00am | HI+BI+NS+TR-ThM4 Channeling via Transmission He Ion Microscopy Christoph Herrmann, Simon Fraser University, Canada, S.A. Scott, M. Lagally, University of Wisconsin-Madison, K. Kavanagh, Simon Fraser University, Canada |
| 9:20am | HI+BI+NS+TR-ThM5 Rapid Imaging of Nano-Porous Catalyst Particles Via Helium Ion Microscopy M.J. Burch, A.V. Ievlev, Holland Hysmith, Oak Ridge National Laboratory, K. Mahady, P.D. Rack, University of Tennessee, L. Luo, ExxonMobil Chemical Company, A. Belianinov, Oak Ridge National Laboratory, S. Yakovlev, ExxonMobil Chemical Company, O.S. Ovchinikova, Oak Ridge National Laboratory |
| 9:40am | HI+BI+NS+TR-ThM6 Ion Beam Induced Current Measurements of Solar Cells with Helium Ion Microscopy A. Belianinov, S. Kim, Ryan Cannon, M.J. Burch, S. Jesse, O.S. Ovchinnikova, Oak Ridge National Laboratory |
| 11:00am | HI+BI+NS+TR-ThM10 Writing Magnetic Domains with a Helium Ion Microscope Daniel Emmrich, Bielefeld University, Germany, A. Gaul, D. Holzinger, A. Ehresmann, University of Kassel, Germany, F. Karimian, M. Klug, J. McCord, Kiel University, Germany, A. Beyer, A. Gölzhäuser, Bielefeld University, Germany |
| 11:20am | HI+BI+NS+TR-ThM11 Characterisation of Nanomaterials on the Helium Ion Microscope using Correlative Secondary Electron and Mass Filtered Secondary Ion Imaging J.-N. Audinot, D.M.F. Dowsett, F. Vollnhals, T. Wirtz, Luxembourg Institute of Science and Technology (LIST), Luxembourg, John A. Notte, Carl Zeiss Microscopy, LLC |