| AVS 64th International Symposium & Exhibition | |
| Spectroscopic Ellipsometry Focus Topic | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 1:40pm | EL+AS+EM-MoA1 Temperature Dependent Mueller Matrix Measurements of Magnetised Ni near the Curie Temperature Farzin Abadizaman, S. Zollner, New Mexico State University |
| 2:00pm | EL+AS+EM-MoA2 Ellipsometry Based Observation of Material Ordering Process in Holography Hao Jiang, H. Peng, Y. Liao, S. Liu, Huazhong University of Science and Technology, China |
| 2:20pm | EL+AS+EM-MoA3 Invited Paper Coherence in Polarimetry and Ellipsometry: Synthesizing Mueller Matrices in an Ellipsometer Oriol Arteaga, Departament de Física Aplicada, Universitat de Barcelona, Spain |
| 3:00pm | EL+AS+EM-MoA5 Femtosecond Spectroscopic Ellipsometry on Optoelectronic Materials and Photonic Structures Mateusz Rebarz, S.J. Espinoza, ELI Beamlines - Czech Academy of Science, Czech Republic, S. Richter, O. Herrfurth, R. Schmidt-Grund, Universität Leipzig, Germany, J. Andreasson, Chalmers University of Technology, Sweden, S. Zollner, New Mexico State University |
| 3:20pm | EL+AS+EM-MoA6 Temperature Dependence of the Dielectric Function and Interband Critical Points of Bulk Germanium Carola Emminger, N. Samarasingha, F. Abadizaman, N.S. Fernando, S. Zollner, New Mexico State University |
| 4:00pm | EL+AS+EM-MoA8 VUV Magneto-Optical Transient Ellipsometer Shirly Espinoza, J. Andreasson, Institute of Physics ASCR, Czech Republic |
| 4:20pm | EL+AS+EM-MoA9 Infrared Ellipsometric Spectroscopy of Hg1-xCdxTe Bulk Samples Yanqing Gao, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, China |
| 4:40pm | EL+AS+EM-MoA10 Infrared Ellipsometry Study of the Photo-generated Charge Carriers at the (001) and (110) Surfaces of SrTiO3 Crystals and the Interface of Corresponding LaAlO3/SrTiO3 Heterostructures Meghdad Yazdi-Rizi, P. Marsik, B. Mallett, University of Fribourg, Switzerland, K. Sen, A. Cerreta, University of Fribourg, A. Dubroka, Masaryk University, M. Scigaj, F. Sánchez, G. Herranz, Institut de Ciència de Materials de Barcelona, C. Bernhard, University of Fribourg, Switzerland |