AVS 64th International Symposium & Exhibition


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Spectroscopic Ellipsometry Focus Topic Sessions

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Start Time Session Code Session Title
Monday 8:20am EL+AS+EM+TF-MoM Application of SE for the Characterization of Thin Films and Nanostructures
Monday 1:40pm EL+AS+EM-MoA Spectroscopic Ellipsometry: Novel Applications and Theoretical Approaches
Tuesday 6:30pm EL-TuP Spectroscopic Ellipsometry Poster Session

AVS 64th International Symposium & Exhibition