AVS 64th International Symposium & Exhibition
    Spectroscopic Ellipsometry Focus Topic Monday Sessions
       Session EL+AS+EM-MoA

Paper EL+AS+EM-MoA9
Infrared Ellipsometric Spectroscopy of Hg1-xCdxTe Bulk Samples

Monday, October 30, 2017, 4:20 pm, Room 9

Session: Spectroscopic Ellipsometry: Novel Applications and Theoretical Approaches
Presenter: Yanqing Gao, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, China
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The infrared spectroscopic ellipsometry of Hg1-xCdxTe (x=0.195~0.37) bulk samples with different compositions were meaured. The refractive index n and extinction coefficient k were obtained. An obvious refractive index enhancement effect was observed in the refractive index spectra for each composition. The energy position of the maximal refractive index value equals approximately that of the band gap. With the decrease of the component, the refractive index increased and the peak position shifted to the low energy direction, which consistented with the absorption edge. The refractive index n at Eg changed linearly with the composition x.