| AVS 64th International Symposium & Exhibition | |
| Spectroscopic Ellipsometry Focus Topic | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | EL+AS+EM+TF-MoM1 Invited Paper Ultra-thin Plasmonic Metal Nitrides: Optical Properties and Applications Alexandra Boltasseva, Purdue University |
| 9:00am | EL+AS+EM+TF-MoM3 Magnetron Sputtering of TiN Coatings: Optical Monitoring of the Growth Process by Means of Spectroscopic Ellipsometry Jiri Bulir, J. More Chevalier, L. Fekete, J. Remiasova, M. Vondracek, M. Novotny, J. Lancok, Institute of Physics ASCR, Czech Republic |
| 9:20am | EL+AS+EM+TF-MoM4 Variable Temperatures Spectroscopic Ellipsometry Study of the Optical Properties of InAlN/GaN Grown on Sapphire Y. Liang, Guangxi University, China, H.G. Gu, Huazhong University of Science and Technology, China, J. Xue, Xidian University, China, Chuanwei Zhang, Huazhong University of Science and Technology, China, Q. Li, Guangxi University, China, Y. Hao, Xidian University, China, S.Y. Liu, Huazhong University of Science and Technology, China, Q. Yang, L. Wan, Z.C. Feng, Guangxi University, China |
| 9:40am | EL+AS+EM+TF-MoM5 Optical Properties of Cs2AgIn(1-x)BixCl6 Double Perovskite Studied by Spectroscopic Ellipsometry Honggang Gu, S.R. Li, B.K. Song, J. Tang, S.Y. Liu, Huazhong University of Science and Technology, China |
| 10:00am | EL+AS+EM+TF-MoM6 Charge Carrier Dynamics of Aluminum-doped Zinc Oxide Deposited by Spatial Atomic Layer Deposition Daniel Fullager, G. Boreman, T. Hofmann, University of North Carolina at Charlotte, C.R. Ellinger, Eastman Kodak Company |
| 10:40am | EL+AS+EM+TF-MoM8 Invited Paper Broad Range Ellipsometry Shining Light onto Multiphase Plasmonic Nanoparticles Synthesis, Properties and Functionality Maria Losurdo, CNR-NANOTEC, Italy |
| 11:20am | EL+AS+EM+TF-MoM10 Use of Evolutionary Algorithms for Ellipsometry Model Development and Validation using Eureqa Neil Murphy, Air Force Research Laboratory, L. Sun, General Dynamics Information Technology, J.G. Jones, Air Force Research Laboratory, J.T. Grant, Azimuth Corporation |
| 11:40am | EL+AS+EM+TF-MoM11 Excitonic Effects on the Optical Properties of Thin ZnO Films on Different Substrates Nuwanjula Samarasingha, Z. Yoder, S. Zollner, New Mexico State University, D. Pal, A. Mathur, A. Singh, R. Singh, S. Chattopadhyay, Indian Institute of Technology Indore, India |