AVS 62nd International Symposium & Exhibition
    Plasma Science and Technology Wednesday Sessions

Session PS+TF-WeA
Plasma Deposition and Plasma Assisted ALD

Wednesday, October 21, 2015, 2:20 pm, Room 210A
Moderator: Sumit Agarwal, Colorado School of Mines


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

2:20pm PS+TF-WeA1 Invited Paper
Plasma Prize Talk: Plasma Processing of Materials: What makes Plasma Special and Future Outlook?
Richard van de Sanden, DIFFER
3:00pm PS+TF-WeA3
Feature Scale Simulation of Atomic Layer Deposition via FPS3D
Paul Moroz, Tokyo Electron US Holdings, D.J. Moroz, University of Pennsylvania
3:20pm PS+TF-WeA4
Plasma Enhanced Atomic Layer Deposition Applications using an Ion Source
F. Papa, Gencoa USA, V. Bellido-Gonzalez, H. Li, Gencoa Ltd, UK, HD. Ngo, University of Applied Sciences Berlin, Germany, K. Kröhnert, Fraunhofer Institut IZM Berlin, Germany, O. Ehrmann, K.D. Lang, P. Mackowiak, Piotr, TU Berlin, Germany, William Sproul, Reactive Sputtering, Inc
4:20pm PS+TF-WeA7
Plasma-Assisted ALD of SiNx: The Surface Chemistry Studied by Infrared Spectroscopy
Roger Bosch, L.E. Cornelissen, C.K. Ande, W.M.M. Kessels, Eindhoven University of Technology, The Netherlands
4:40pm PS+TF-WeA8
Structural Characterization of Surface Dielectric Barrier Discharges (SDBD) for Atmospheric Pressure Plasma Enhanced Spatial ALD (PE-S-ALD)
Yves Creyghton, J. Emmelkamp, F. Roozeboom, TNO Technical Sciences, Netherlands
5:00pm PS+TF-WeA9 Invited Paper
Plasma Deposited Barrier Coatings on Plastics: Plasma Characterization and Thin Film Analysis
Peter Awakowicz, F. Mitschker, Ruhr-University Bochum, Germany, A. Nave, INP-Greifswald, Germany, J. Röpcke, INP-Greifswald, G. Grundmeier, Univ. of Paderborn
5:40pm PS+TF-WeA11
Flexible, Durable, Self-Cleaning Optical Coatings for Optoelectronics
Thomas Fuerst, C.A. Wolden, Colorado School of Mines
6:00pm PS+TF-WeA12
Microwave Plasma Assisted Chemical Vapor Deposition of High Quality, Single Crystal Diamond Substrates
Shreya Nad, Y. Gu, J. Asmussen, Michigan State University