| AVS 58th Annual International Symposium and Exhibition | |
| Applied Surface Science Division | Wednesday Sessions |
| Session AS-WeA |
| Session: | Correlative Analysis - A Multi-technique Approach for Identification and Structure-Property Relationships |
| Presenter: | Kathryn Lloyd, DuPont Corporate Center for Analytical Sciences |
| Authors: | K.G. Lloyd, DuPont Corporate Center for Analytical Sciences D.J. Walls, DuPont Corporate Center for Analytical Sciences L. Zhang, DuPont Corporate Center for Analytical Sciences J.P. Wyre, DuPont Corporate Center for Analytical Sciences |
| Correspondent: | Click to Email |
There are now many examples of multivariate analysis of surface-specific technique data[1,2]. These include multivariate statistical methods such as Principal Components Analysis (PCA), Partial Least Squares (PLS), or Multivariate Curve Resolution (MCR) applied to so-called “hyperspectral” mapping data, in which hundreds of channels of spectral data are collected at each pixel of a two-dimensional pixel array spanning an area of interest. The idea of trying to mathematically correlate different sets of mapping data from the same area is not new[3], and falls under the broader category of ‘image fusion’ used in conjunction with remote sensing applications[4]. However, this approach is not prevalent in the surface science literature, with the notable exception of Fulghum and Artyushkova[5,6].
There are good reasons for this, from both the experimental and modeling perspectives. This talk will discuss the challenges associated with mathematically correlating spectroscopic and mapping data from multiple surface-specific techniques. Examples from the literature and the analytical lab will be discussed.
[1]V. S. Smentkowski, J. A.Ohlhausen, P. G. Kotula, M. R. Keenan, Applied Surface Science 2004, 231, 245.
[2] M. S. Wagner, D. J. Graham, B. D. Ratner, D. G. Castner, Surface Science 2004, 570, 78.
[3] H. Hutter, M. Grasserbauer, Chemometrics and Intelligent Laboratory Systems 1994, 24, 99.
[4] C. Pohl, J. L. Van Genderen., International Journal of Remote Sensing 1998, 19, 823.
[5] K. Artyushkova, J. E. Fulghum, ‘‘XPS and Confocal Microscopy Data Fusion for Polymer Characterization,’’ talk presented at American Vacuum Society 50th International Symposium held in Baltimore, MD November 2–7, 2003.
[6] K. Artyushkova, S. Pylypenko, J. Fenton, K. Archuleta, L.Williams, J. Fulghum, Microscopy and Microanalysis 2006, 12(Suppl. 02), 1402.