| AVS 56th International Symposium & Exhibition | |
| Applied Surface Science | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| AS-TuP1 XPS Characterisation of Thiol-SAMs on Au Surfaces for Biological Applications V. Trouillet, Forschungszentrum Karlsruhe GmbH, Germany, S. Engin, D. Wedlich, University of Karlsruhe, Germany, P. Mack, R.G. White, Thermo Fisher Scientific, UK, M. Bruns, Forschungszentrum Karlsruhe GmbH, Germany |
| AS-TuP2 Dielectric Response of AlSb Determined by In-Situ Ellipsometry Y.W. Jung, T.H. Ghong, J.S. Byun, S. Kim, Y.H. Cha, Y.D. Kim, Kyung Hee University, Korea, H.J. Kim, Y.C. Chang, Academia Sinica, Taiwan and University of Illinois at Urbana-Champaign, S.H. Shin, J.D. Song, Korea Institute of Science and Technology, Korea |
| AS-TuP3 Crossing of the E2, E2+Δ2, E2' and E2' + Δ2' CPs in InAsxSb1-x Alloys as Determined by Spectroscopic Ellipsometry J.J. Yoon, T.J. Kim, S.Y. Hwang, Y.J. Kang, Kyung Hee University, Korea, D.E. Aspnes, Kyung Hee University, Korea and North Carolina State University, Y.D. Kim, Kyung Hee University, Korea, H.J. Kim, Y.C. Chang, Academia Sinica, Taiwan and University of Illinois at Urbana-Champaign, J.D. Song, Korea Institute of Science and Technology, Korea |
| AS-TuP4 Gold Nanodot Array on Silicon Fabricated by Scanning Probe Lithography M, Kanda, T. Ichii, K. Murase, H. Sugimura, Kyoto University, Japan |
| AS-TuP5 Ultrashort Pulse Laser Ablation as a Tool for the Depth Profiling of Staphylococcus Epidermidis Microbial Biofilms S. Milasinovic, M. Blaze, Y. Liu, Y. Zhao, J. Johnston, R.J. Gordon, L. Hanley, University of Illinois at Chicago |
| AS-TuP6 Vacuum Ultraviolet Light Induced Chemical Modification of Cyclo-Olefin Polymer Surface Dependent of the Irradiation Atmosphere Y.J. Kim, H. Sugimura, K. Murase, Kyoto University, Japan, Y. Taniguchi, Y. Taguchi, Alps Electric, Japan |
| AS-TuP7 Dynamic Solid-liquid Interaction on Hydrophilic Surfaces Y. Yokota, N. Yoshida, The University of Tokyo, Japan, M. Sakai, Kanagawa Academy of Science and Technology, Japan, A. Nakajima, Tokyo Institute of Technology, Japan, T. Watanabe, The University of Tokyo, Japan |
| AS-TuP8 Relationship between In-Depth Profiles and Local Structures in HfSiO Film Studied by Photoemission Spectroscopy and Extended X-Ray Absorption Fine Structure S. Toyoda, The University of Tokyo, Japan, H. Ohfuchi, JASRI, H. Kamada, M. Oshima, The University of Tokyo, Japan, G. Liu, Z. Liu, T. Sukegawa, K. Ikeda, STARC |
| AS-TuP9 In Situ XPS Depth-Profiling of Hydrogen Storage Material VCrTi during Thermal Annealing J.R. Harries, Y. Teraoka, A. Yoshigoe, M. Tode, Japan Atomic Energy Agency |
| AS-TuP10 Automated XPS Analysis of Passivated Stainless Steel to the SEMI Standard T.S. Nunney, O. Mustonen, J. Wostenholme, Thermo Fisher Scientific, UK, B.R. Strohmeier, J.D. Piasecki, R.J. Lee, RJ Lee Group, Inc. |
| AS-TuP11 Vacuum Annealing Phenomena in Ultrathin TiDy/Pd Bi-Layer Films Evaporated on Si(100) as Studied by TEM and XPS E.G. Keim, University of Twente, The Netherlands, W. Lisowski, Polish Academy of Sciences, Poland |
| AS-TuP13 Investigation of Metal-Assisted SIMS and Cluster Ion Bombardment for Analysis of Polystyrene Surfaces H.F. Arlinghaus, F. Lipinsky, Westfälische Wilhelms-Universität Münster, Germany, N. Wehbe, A. Delcorte, P. Bertrand, Université Catholique de Louvain, Belgium, L. Hoissiau, University of Namur, Belgium, A. Heile, Westfälische Wilhelms-Universität Münster, Germany |
| AS-TuP14 Surface Analysis of Electro-Polished Niobium Cavity-Samples for RF Applications P.V. Tyagi, M. Nishiwaki, T. Saeki, M. Sawabe, H. Hayano, KEK, Japan, T. Noguchi, KAKEN Inc., Japan, S. Kato, KEK, Japan |
| AS-TuP15 Kelvin Probe Force Microscopy on Phase-Separated Self-Assembled Monolayers of Alkanethiol and Amide-Containing Alkanethiol S. Ikebukuro, Kyoto University, Japan |
| AS-TuP16 Surface Potential Measurement of Organo-Chalcogenide Self-Assembled Monolayers using Kelvin Probe Force Microscopy T. Ichii, S. Nanjo, S. Ikebukuro, K, Miki, K. Murase, K. Ohe, H. Sugimura, Kyoto University, Japan |
| AS-TuP17 Lattices of Freestanding Carbon Nanofibres Characterized by Spectroscopic Ellipsometry R. Magnusson, Linköping University, Sweden, R. Rehammar, Göteborg University, Sweden, H. Arwin, Linköping University, Sweden |
| AS-TuP19 Spectroscopic Ellipsometry of Bulk MAX-phases A. Mendoza-Galvan, Cinvestav-Queretaro, Mexico, M. Rybka, K. Järrendahl, H. Arwin, M. Magnuson, L. Hultman, Linköping University, Sweden, M. Barsoum, Drexel University |
| AS-TuP20 In-Situ Synperonic Film Growth on Self Assembled Monolayers and Organic Polymers Investigation Using Quartz Crystal Microbalance in Conjunction with Spectroscopic Ellipsometry A. Kjerstad, T. Hofman, E. Schubert, M. Schubert, University of Nebraska - Lincoln |
| AS-TuP21 Ellipsometric Study of Ga-Doped ZnO Films Deposited on Large Area Substrates by Pulsed Laser Deposition D. Agresta, K. Leedy, B. Bayraktaroglu, U.S. Air Force Research Laboratory |
| AS-TuP22 The Optimized Wet Cleaning for Extreme Ultraviolet (EUV) Masks: Cleaning Efficiency for Residual Photoresist and Ru Capping Layer Surface H. Seo, J.Y. Park, University of California, Berkeley and Lawrence Berkeley National Laboratory, T. Liang, Intel Corporation, G.A. Somorjai, University of California, Berkeley and Lawrence Berkeley National Laboratory |
| AS-TuP23 XPS and RBS Quantification of Pulsed Laser Deposition of LAO/STO Heterostructures: Unexpected Variations in Stoichiometry M.H. Engelhard, T. Droubay, V. Shutthanandan, D.R. Baer, S.A. Chambers, Pacific Northwest National Laboratory |
| AS-TuP24 Complete Analysis of Materials using Complementary Techniques V.S. Smentkowski, D. Wark, L. Le Tarte, H. Piao, J.C. Chera, S.G. Ostrowski, A. Suzuki, General Electric Global Research |
| AS-TuP25 Field Emission from Two-Dimensional Electron Gas in Hetero-Junctions of InAlAs/InGaAs Multiple Quantum Wells Y. Itakura, M. Matsumoto, K. Fukutani, T. Okano, The University of Tokyo, Japan |
| AS-TuP29 Characterization of Silver Nanoparticles Synthetized on Nylon Membranes Used as Nanoreactors L. Huerta, Universidad Nacional Autónoma de México, V. Sánchez-Mendieta, R.A. Morales-Luckie, S. Reyes-Vega, Universidad Autónoma del Estado de México, M. Flores, CUCEI, Universidad de Guadalajara, México, J. Arenas Alatorre, Universidad Nacional Autónoma de México |
| AS-TuP32 Transport Properties of Doped SiGeSn Alloys V. D'Costa, Y. Fang, J. Menendez, J. Kouvetakis, Arizona State University |
| AS-TuP33 Topographical Study of TiN "Ion-CCD" Detector Surface: How damaging are sub-fA Ion Beams of 1‑keV Energy? O. Hadjar, G. Kibelka, O.I. Analytical |