AVS 56th International Symposium & Exhibition
    Applied Surface Science Tuesday Sessions
       Session AS-TuP

Paper AS-TuP13
Investigation of Metal-Assisted SIMS and Cluster Ion Bombardment for Analysis of Polystyrene Surfaces

Tuesday, November 10, 2009, 6:00 pm, Room Hall 3

Session: Applied Surface Science Poster Session
Presenter: H.F. Arlinghaus, Westfälische Wilhelms-Universität Münster, Germany
Authors: H.F. Arlinghaus, Westfälische Wilhelms-Universität Münster, Germany
F. Lipinsky, Westfälische Wilhelms-Universität Münster, Germany
N. Wehbe, Université Catholique de Louvain, Belgium
A. Delcorte, Université Catholique de Louvain, Belgium
P. Bertrand, Université Catholique de Louvain, Belgium
L. Hoissiau, University of Namur, Belgium
A. Heile, Westfälische Wilhelms-Universität Münster, Germany
Correspondent: Click to Email

In addition to structural information, a good knowledge of the local chemistry proves to be of ever greater importance for the development of new types of materials as well as for specific modifications of interfaces and surfaces. A detailed understanding of the systems is required in multiple fields of the metal and semiconductor industries and for various biomedical and chemical applications. In particular, the ongoing miniaturization and the associated reduction of the volumes of material available for analysis constitute a challenge for the detection limits of quite a number of characterization techniques.

In the case of TOF-SIMS, several methods of secondary ion yield enhancement have been proposed. Our contribution focuses on two of these methods, i.e. metal-assisted SIMS and polyatomic primary ion bombardment (e.g. Bi3+, C60+). In previous studies on thicker layers of organic molecules it was found that polyatomic primary ions generally increase the secondary ion yields and that a yield enhancement due to gold deposition can only be detected for monoatomic ion bombardment [1,2]. To investigate advantages and drawbacks of the use of MetA-SIMS and polyatomic primary ion bombardment in more detail, not only thicker layers of several ten nanometers but also layers of only some nanometers thickness of polystyrene were prepared. The samples, pristine and metallized with different amounts of gold, were analyzed using monoatomic and polyatomic primary ions.

[1] A. Heile, D. Lipinsky, N. Wehbe, A. Delcorte, P. Bertrand, A. Felten, L. Houssiau, J.J. Pireaux, R. De Mondt, P. Van Royen, L. Van Vaeck, H. F. Arlinghaus, Surf. Interface Anal. 40 (2008) 538-542, doi:10.1002/sia.2810.

[2] N. Wehbe, A. Heile, H.F. Arlinghaus, P. Bertrand, A. Delcorte, Anal. Chem. 80 (2008), 6235-6244, doi: 10.1021/ac800568y