AVS 56th International Symposium & Exhibition
    Applied Surface Science Tuesday Sessions
       Session AS-TuP

Paper AS-TuP4
Gold Nanodot Array on Silicon Fabricated by Scanning Probe Lithography

Tuesday, November 10, 2009, 6:00 pm, Room Hall 3

Session: Applied Surface Science Poster Session
Presenter: M, Kanda, Kyoto University, Japan
Authors: M, Kanda, Kyoto University, Japan
T. Ichii, Kyoto University, Japan
K. Murase, Kyoto University, Japan
H. Sugimura, Kyoto University, Japan
Correspondent: Click to Email

Gold nanoobjects are recognized as important materials to construct the advanced nanoscale technology for electronic, optical, and sensor devices because they can transfer a near-field light between them in a well-aligned arrangement. The aligned arrangement of gold nanoobjects requires a preliminarily patterned substrate with the nanometer-scale precision. Scanning probe lithography (SPL) utilizing atomic force microscopy (AFM) is a very powerful technique to fabricate nanoscale patterns even under atmospheric condition.

In this study, a well-aligned array of gold nanodots was fabricated using SPL. A Si(111) surfaces covered with self-assembled monolayers (SAM) of 1-hexadecene (HD) were used as substrates. HD-SAMs have high chemical durability to hydrofluoric acid (HF) and were used as resist film of SPL. Nanoscale patterns of silicon oxides were fabricated by applying DC bias voltages between an AFM probe and the substrate. Since the HD-SAMs had a highly ordered structure and only 2.3 nm thicknesses, the size and the position of the oxides were precisely controlled. Then, the oxides were etched by immersing the samples into HF solution, and the underlying Si surfaces on the nanopatterns were exposed. After the HF etching, the samples were immersed into an Au electroless plating solution and gold nanodots were deposited only on the nanopatterns. The structures and the optical properties of the gold nanodots arrays were investigated by field emission scanning electron microscopy (FE-SEM) and spectrophotometer, respectively.