AVS 56th International Symposium & Exhibition
    Applied Surface Science Tuesday Sessions
       Session AS-TuP

Paper AS-TuP1
XPS Characterisation of Thiol-SAMs on Au Surfaces for Biological Applications

Tuesday, November 10, 2009, 6:00 pm, Room Hall 3

Session: Applied Surface Science Poster Session
Presenter: M. Bruns, Forschungszentrum Karlsruhe GmbH, Germany
Authors: V. Trouillet, Forschungszentrum Karlsruhe GmbH, Germany
S. Engin, University of Karlsruhe, Germany
D. Wedlich, University of Karlsruhe, Germany
P. Mack, Thermo Fisher Scientific, UK
R.G. White, Thermo Fisher Scientific, UK
M. Bruns, Forschungszentrum Karlsruhe GmbH, Germany
Correspondent: Click to Email

Structured and oriented immobilisation of biomolecules has become subject of great interest in recent years due to the expected diversity of applications, e.g. biosensors in diagnosis, lab-on-chip technology, and modern cell culture focused on cell adhesion, migration, and differentiation. Therefore, a lot of effort has been spent to develop strategies for covalent and non-covalent immobilization of proteins, respectively. A very promising approach is surface patterning by micro-contact printing (µCP) to produce self-assembly-monolayers (SAMs) on gold surfaces based on mixtures of benzylguanine thiol (BGT) and matrix thiol. In this case BGT is the substrate for the SNAP-tag system, allowing for covalent attachment of any protein of interest fused to this tag, whereas the inert matrix thiol acts as spacer for BGT and moreover prevents from non-specific protein adsorption.

The present contribution focuses on surface analytical characterization of pure benzylguanine and matrix thiols as well as mixtures of both by means of X-ray photoelectron spectroscopy (XPS) to achieve information on chemical binding states in a non-destructive manner. For this purpose all SAMs were prepared on gold films deposited onto glass substrates by r.f. magnetron sputtering directly prior to the thiol exposure. In particular, XPS proves the covalent binding of the thiols and concentration depth profiles constructed from angle resolved data applying the maximum entropy method reveal the orientation of the SAMs together with thickness information. The µCP micro-structures were verified by small area XPS together with time-of-flight secondary mass spectrometry. In addition, scanning electron microscopy and ellipsometry were used to achieve a comprehensive characterization.