AVS 55th International Symposium & Exhibition
    Synchrotron-based Spectroscopy and Spectro-Microscopy Topical Conference Tuesday Sessions

Session SY+SS+BI-TuM
Synchrotron-based Spectroscopy and Spectro-Microscopy

Tuesday, October 21, 2008, 8:00 am, Room 310
Moderator: M. Grunze, University of Heidelberg, Germany


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:00am SY+SS+BI-TuM1 Invited Paper
X-ray Studies of Hydrogen Bonding in Water; the Liquid Phase and on Surfaces
A.R. Nilsson, SSRL/Stanford University and Stockholm University, Sweden
8:40am SY+SS+BI-TuM3 Invited Paper
Soft X-ray Spectroscopy of Liquids and Liquid-Solid Interfaces
C. Heske, University of Nevada Las Vegas
9:20am SY+SS+BI-TuM5 Invited Paper
High-Resolution X-Ray Photoelectron Spectroscopy as a Versatile Tool for the Characterization of Monomolecular Self-Assembled Films
M. Zharnikov, Universität Heidelberg, Germany
10:40am SY+SS+BI-TuM9 Invited Paper
Chemical Imaging and Spectroscopy at Sufficiently High Spatial Resolution to Uncover Functions of Nanoscale Phenomena
M. Kiskinova, Sincrotrone Trieste, Italy
11:20am SY+SS+BI-TuM11
Hard X-ray Photoelectron Spectroscopy up to 15 keV: State-of-the-Art and Recent Results
M. Merkel, FOCUS GmbH, Germany, J. Rubio-Zuazo, G.R. Castro, SpLine Spanish CRG Beamline at the European Synchrotron Radiation Facility, France, M. Escher, FOCUS GmbH, Germany
11:40am SY+SS+BI-TuM12
A Comparative Study of Interface Formation for Ca/PDHFV and Ca/PHF by Synchrotron Radiation Photoemission
Y.X. Guo, W. Zhao, X.F. Feng, L. Zhang, W.H. Zhang, J.F. Zhu, University of Science and Technology of China