AVS 55th International Symposium & Exhibition | |
Synchrotron-based Spectroscopy and Spectro-Microscopy Topical Conference | Tuesday Sessions |
Session SY+SS+BI-TuM |
Session: | Synchrotron-based Spectroscopy and Spectro-Microscopy |
Presenter: | M. Kiskinova, Sincrotrone Trieste, Italy |
Correspondent: | Click to Email |
The complementary capabilities of different microscopy approaches in terms of imaging, spectroscopy, spatial and time resolution are strongly requested by the multi-disciplinary research programs at the synchrotron facilities and have motivated continuous investments in development of instrumentation for imaging with spectroscopic analysis. The major part of the lecture will be focused on the potential of modern x-ray photoelectron microscopes in chemical imaging and micro-spot photoelectron spectroscopy.1 Among the selected research topics, as representative examples are (i) addressing the surface properties of the individual C and oxide nanostructures and supported catalyst micro and nano-particles (ii) mass transport driven self-reorganization processes which can introduce lateral heterogeneity in the composition and reactive properties of surfaces (iii) quantum-size effects on the local chemical reactivity measured for ultrathin films with spatially varying thickness. The final part of the lecture will briefly illustrate the most recent achievements in combining the potential of soft x-ray transmission microscopy with multiple contrast approaches and fluorescence analysis.
Günther, S., Kaulich B., Gregoratti L., Kiskinova, M.: Prog. Surf. Sci. 70, 187, 2002.