AVS 55th International Symposium & Exhibition
    Synchrotron-based Spectroscopy and Spectro-Microscopy Topical Conference Tuesday Sessions
       Session SY+SS+BI-TuM

Invited Paper SY+SS+BI-TuM9
Chemical Imaging and Spectroscopy at Sufficiently High Spatial Resolution to Uncover Functions of Nanoscale Phenomena

Tuesday, October 21, 2008, 10:40 am, Room 310

Session: Synchrotron-based Spectroscopy and Spectro-Microscopy
Presenter: M. Kiskinova, Sincrotrone Trieste, Italy
Correspondent: Click to Email

The complementary capabilities of different microscopy approaches in terms of imaging, spectroscopy, spatial and time resolution are strongly requested by the multi-disciplinary research programs at the synchrotron facilities and have motivated continuous investments in development of instrumentation for imaging with spectroscopic analysis. The major part of the lecture will be focused on the potential of modern x-ray photoelectron microscopes in chemical imaging and micro-spot photoelectron spectroscopy.1 Among the selected research topics, as representative examples are (i) addressing the surface properties of the individual C and oxide nanostructures and supported catalyst micro and nano-particles (ii) mass transport driven self-reorganization processes which can introduce lateral heterogeneity in the composition and reactive properties of surfaces (iii) quantum-size effects on the local chemical reactivity measured for ultrathin films with spatially varying thickness. The final part of the lecture will briefly illustrate the most recent achievements in combining the potential of soft x-ray transmission microscopy with multiple contrast approaches and fluorescence analysis.

Günther, S., Kaulich B., Gregoratti L., Kiskinova, M.: Prog. Surf. Sci. 70, 187, 2002.