AVS 55th International Symposium & Exhibition
    Synchrotron-based Spectroscopy and Spectro-Microscopy Topical Conference Tuesday Sessions
       Session SY+SS+BI-TuM

Invited Paper SY+SS+BI-TuM3
Soft X-ray Spectroscopy of Liquids and Liquid-Solid Interfaces

Tuesday, October 21, 2008, 8:40 am, Room 310

Session: Synchrotron-based Spectroscopy and Spectro-Microscopy
Presenter: C. Heske, University of Nevada Las Vegas
Correspondent: Click to Email

With the advent of high-brightness synchrotron radiation in the soft x-ray regime it has become possible to investigate vacuum-incompatible sample systems such as liquids using suitably designed in-situ cells. In such cells, thin membranes (e.g., made of SiC, SiN_x, or polyimide) separate non-vacuum sample environments from the ultra-high vacuum necessary for soft x-ray synchrotron beamlines. If the membranes are thin (e.g., on the order of 100 nanometer to 1 micrometer), it is possible to transmit soft x-rays with sufficient intensity for spectroscopic experiments. Two experimental techniques are of particular interest, namely x-ray absorption spectroscopy (XAS) to study unoccupied electronic states and x-ray emission spectroscopy (XES) to investigate the occupied electronic levels. The combination of the two approaches, i.e., the collection of XES spectra at variable resonant excitation (resonant inelastic soft x-ray scattering - RIXS), gives unprecedented insight into the electronic structure of hitherto inaccessible samples, such as liquids and liquid-solid interfaces. In this presentation, the experimental requirements for such studies will be discussed and it will be demonstrated how XAS, XES, and RIXS can give unique insights into the electronic, chemical, and dynamic properties of liquids (in particular water) and liquid-solid interfaces.