| 2:00pm | PS-MoA1 Plasma Etching - The Early Days
 J.W. Coburn, University of California at Berkeley
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    | 2:20pm | PS-MoA2 Invited Paper Following Moore’s Law – How Many Knobs are Enough?
 R.A. Gottscho, K. Smekalin, Lam Research
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    | 3:00pm | PS-MoA4 Real Time and 3D Characterization Techniques to Control Plasma Etch Processeses at the Nanometer Scale
 O. Joubert, CEA/LETI-Minatec, France
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    | 3:20pm | PS-MoA5 Investigations of Plasma-Polymer Interactions For Nanoscale Patterning of Materials1,2
 G.S. Oehrlein, University of Maryland
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    | 4:00pm | PS-MoA7 Will Recombination Reaction Probabilities at Plasma Chamber Walls Ever Be Non-Adjustable Parameters?
 V.M. Donnelly, University of Houston
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    | 4:20pm | PS-MoA8 Ion-Surface Interactions Beyond Etching
 K.P. Giapis, California Institute of Technology
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    | 4:40pm | PS-MoA9 Can Plasma Modeling Be a Predictive Tool in Process Development?: Etching of Very High Aspect Ratio Features and Gate Stacks
 M. Wang, Y. Yang, J. Shoeb, M.J. Kushner, Iowa State University
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    | 5:00pm | PS-MoA10 Predictive Etch Profile under Competition Among Deposition, Etching, and Charging on Dielectrics in a Low Temperature Plasma
 T. Makabe, Keio University, Japan
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    | 5:20pm | PS-MoA11 Silicon Processing Technologies in Adjacent Spaces: Applications Beyond Information Technology
 T. Dalton, IBM
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