| AVS 54th International Symposium | |
| Applied Surface Science | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 1:40pm | AS-TuA1 XPS, TEM, and SIMS Analysis of FIB Bombarded Surfaces Over the Range 500 eV to 30 keV J.E. Fulghum, K. Artyushkova, University of New Mexico, L.A. Giannuzzi, B. Van Leer, J. Ringnalda, FEI Company, F.A. Stevie, D.P. Griffis, North Carolina State University |
| 2:00pm | AS-TuA2 3-D XPS Characterization of Organics Surfaces J.S. Hammond, S. Raman, J. Moulder, Physical Electronics, N. Sanada, R. Inoue, M. Suzuki, ULVAC-PHI |
| 2:20pm | AS-TuA3 C60 Molecular Depth Profiling: A Fundamental Study using a 3D Organic System A.G. Shard, I.S. Gilmore, National Physical Laboratory, UK |
| 2:40pm | AS-TuA4 Invited Paper Prospects for Electron Tomography with Atomic Resolution C.F. Kisielowski, Lawrence Berkeley National Laboratory, F.R. Chen, National Tsing Hua University, Taiwan |
| 4:00pm | AS-TuA8 Retrospective and Multivariate Statistical Analysis of Three-Spatial-Dimension ToF-SIMS Data Sets V.S. Smentkowski, S.G. Ostrowski, General Electric Global Research, M.R. Keenan, J.A. Ohlhausen, P.G. Kotula, Sandia National Laboratories |
| 4:20pm | AS-TuA9 3D Molecular Characterization of a Drug Delivery System G.L. Fisher, Physical Electronics, A. Belu, Medtronic Inc., K. Wormuth, SurModics Inc. |
| 4:40pm | AS-TuA10 3D Image Acquiring and Spectrum Extraction from 2D Elemental Mapping in Auger Electron Spectroscopy N. Urushihara, S. Iida, N. Sanada, ULVAC-PHI, Inc., Japan, D.F. Paul, S. Bryan, Physical Electronics, M. Suzuki, ULVAC-PHI, Inc., Japan, Y. Nakajima, T. Hanajiri, Toyo University, Japan |
| 5:00pm | AS-TuA11 Nanospectroscopy of Single Silicon Nanowire Surface using Energy Filtered X-ray PhotoElectron Emission Microscopy (XPEEM) O. Renault, A. Bailly, CEA-LETI Minatec, France, N. Barrett, L.-F. Zagonel, DSM/DRECAM/SPCSI, France, N. Pauc, P. Gentile, CEA DRFMC, SiNAPS, France, T. Baron, CNRS-LTM, France |