| AVS 66th International Symposium & Exhibition | |
| Exhibitor Technology Spotlight Workshops | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 12:20pm | EW-TuL2 New Developments from Thermo Fisher Scientific Timothy Nunney, P. Mack, R.E. Simpson, A. Bushell, Thermo Fisher Scientific, UK |
| 12:40pm | EW-TuL3 New Trends in Photoelectron Spectroscopy: Momentum Resolved Photoelectron Spectroscopy, Spin-resolved ARPES, Small Spot and Hard X-ray XPS A. Thissen, SPECS Surface Nano Analysis GmbH, Germany, Thomas Stempel Pereira, SPECS Surface Nano Analysis GmbH |
| 1:00pm | EW-TuL4 Latest Trends and Instrumentation for TOF-SIMS Nathan Havercroft, IONTOF USA, Inc. |
| 1:20pm | EW-TuL5 New Versatile and Compact In Situ AugerProbe from Staib Instruments for REELS & Auger Analyses in Growth Environments Even Under Higher Pressures Eric Dombrowski, Staib Instruments, Inc. |
| 1:40pm | EW-TuL6 Kratos Analytical – 50 Years of XPS Christopher Blomfield, Kratos Analytical Limited, UK |
| 2:00pm | EW-TuL7 What's New at PHI K. Artyushkova, J.E. Mann, B.W. Schmidt, L. Swartz, John Newman, Physical Electronics |