AVS 66th International Symposium & Exhibition
    Exhibitor Technology Spotlight Workshops Tuesday Sessions
       Session EW-TuL

Paper EW-TuL3
New Trends in Photoelectron Spectroscopy: Momentum Resolved Photoelectron Spectroscopy, Spin-resolved ARPES, Small Spot and Hard X-ray XPS

Tuesday, October 22, 2019, 12:40 pm, Room Hall A

Session: Exhibitor Technology Spotlight Workshop II
Presenter: Thomas Stempel Pereira, SPECS Surface Nano Analysis GmbH
Authors: A. Thissen, SPECS Surface Nano Analysis GmbH, Germany
T. Stempel Pereira, SPECS Surface Nano Analysis GmbH
Correspondent: Click to Email
Over the last two decades, significant developments have been done in Photoelectron Spectroscopy instrumentation. The significant expansion of XPS into near ambient pressure environments (NAP-XPS), especially new concepts for electron optics, new concepts for X-ray sources, and new type of detectors have opened the field for new applications.

New electron optical concepts have been introduced, allowing for K-resolving lenses in Angle resolved Photoelectron Spectroscopy and Small Spot Momentum Spectroscopy and Microscopy. The brand new ASTRAIOS 150 is a consequently k-resolving hemispherical analyzer for cutting-edge ARPES with large acceptance angles at ultimate energy and k- (or angle) resolutions. For limiting the acceptance areas to µm-ranges or momentum microscopy applications k-resolving immersion lenses have to be used. The KREIOS 150 series demonstrates perfectly the applications to small and/or inhomogeneous samples.

On the detector field the 2D-CMOS detector has proven to be the perfect choice for ultimate resolution and highest linearity at significant time resolution. Especially for momentum microscopy the direct imaging spin detector DISpin allow for highest sensitivities and uncompromising energy and k-resolutions.

Switching gears, on the XPS field the above mentioned new analyzers also can make a significant contribution to small spot-XPS. On the other hand still a high power small spot monochromatic X-ray source is needed. Thus the µFOCUS 195 is presented for the first time, being a Al Ka and Ag La dual anode monochromator source is presented, with a spot diameter smaller than 10µm.

For higher information depth the µFOCUS 730 HE is presented, a Cr Ka monochromator source with a 100µm spot size for laboratory HAXPES and NAP-HAXPES.