AVS 66th International Symposium & Exhibition
    Exhibitor Technology Spotlight Workshops Tuesday Sessions
       Session EW-TuL

Paper EW-TuL4
Latest Trends and Instrumentation for TOF-SIMS

Tuesday, October 22, 2019, 1:00 pm, Room Hall A

Session: Exhibitor Technology Spotlight Workshop II
Presenter: Nathan Havercroft, IONTOF USA, Inc.
Correspondent: Click to Email
During the last 30 years IONTOF has continuously made significant development efforts to further improve the instrumentation for Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) and related techniques. Some of the most recent achievements include in-situ sample preparation and tomography by FIB, enhancement of maximum count rates and dynamic range in conventional depth profiling of inorganic materials, the design of a TOF-SIMS / SPM combination instrument, as well as the integration of an OrbitrapTM mass spectrometer with unrivalled mass resolution and mass accuracy into the TOF.SIMS 5 instrument.

In this spotlight session we will showcase the latest TOF-SIMS developments from IONTOF.