| AVS 66th International Symposium & Exhibition | |
| Spectroscopic Ellipsometry Focus Topic | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | EL+AS+EM+TF-WeM1 Enhanced Strong Near Band Edge Emission from Lanththanide Doped Sputter Deposited ZnO C.L. Heng, Beijing Institutute of Technology, China, W. Xiang, T. Wang, Beijing Institutete of Technology, China, W.Y. Su, Beijing Instititute of Technology, China, P.G. Yin, Beihang University, China, Terje G Finstad, University of Oslo, Norway |
| 8:20am | EL+AS+EM+TF-WeM2 Ellipsometry Study of PLD based Temperature Controlled Thin Film Depositions of CdSe on ITO Substrates Flavia Inbanathan, Ohio University, M. Ebdah, King Saud University, Kingdom of Saudi Arabia, P. Kumar, Gurukula Kangri Vishwavidyalaya, India, K. Dasari, Texas State University, R.S. Katiyar, University of Puerto Rico, W.M. Jadwisienczak, Ohio University |
| 8:40am | EL+AS+EM+TF-WeM3 Invited Paper The Application of Mueller Matrix Spectroscopic Ellipsometry to Scatterometry Measurement of Feature Dimension and Shape for Integrated Circuit Structures Alain C. Diebold, SUNY Polytechnic Institute |
| 9:20am | EL+AS+EM+TF-WeM5 Optical Constants and Thickness of Ultrathin Thermally Evaporated Iron Films Nick Allen, D.S. Shah, R.R. Vanfleet, M.R. Linford, R.C. Davis, Brigham Young University |
| 9:40am | EL+AS+EM+TF-WeM6 Birefringent Photonic Crystals for Polarization-discriminatingInfrared Focal Plane Arrays Marc Lata, Y. Li, S. Park, M.J. McLamb, T. Hofmann, University of North Carolina at Charlotte |
| 11:00am | EL+AS+EM+TF-WeM10 Relevance of hidden Valleys in the Dequenching of Room-temperature-emitting Ge Layers T. Sakamoto, Y. Yasutake, University of Tokyo, Japan, J. Kanasaki, Osaka City University, Japan, Susumu Fukatsu, University of Tokyo, Japan |
| 11:20am | EL+AS+EM+TF-WeM11 Invited Paper Spectroscopic Ellipsometry on Organic Thin Films - From in-situ Bio-sensing to Active Layers for Organic Solar Cells Eva Bittrich, P. Uhlmann, K.-J. Eichhorn, Leibniz Institute of Polymer Research Dresden, Germany, M. Schubert, University of Nebraska-Lincoln, Linköping University, Sweden, Leibniz Institute of Polymer Research Dresden, Germany, M. Levichkova, K. Walzer, Heliatek GmbH, Germany |
| 12:00pm | EL+AS+EM+TF-WeM13 Optical Dielectric Function of Si(bzimpy)2 – A Hexacoordinate Silicon Pincer Complex Determined by Spectroscopic Ellipsometry Yanzeng Li, M. Kocherga, S. Park, M. Lata, M.J. McLamb, G.D. Boreman, T.A. Schmedake, T. Hofmann, University of North Carolina at Charlotte |