| AVS 66th International Symposium & Exhibition | |
| Spectroscopic Ellipsometry Focus Topic | Wednesday Sessions |
| Session EL+AS+EM+TF-WeM |
| Session: | Optical Characterization of Thin Films and Nanostructures |
| Presenter: | Eva Bittrich, Leibniz Institute of Polymer Research Dresden, Germany |
| Authors: | E. Bittrich, Leibniz Institute of Polymer Research Dresden, Germany P. Uhlmann, Leibniz Institute of Polymer Research Dresden, Germany K.-J. Eichhorn, Leibniz Institute of Polymer Research Dresden, Germany M. Schubert, University of Nebraska-Lincoln, Linköping University, Sweden, Leibniz Institute of Polymer Research Dresden, Germany M. Levichkova, Heliatek GmbH, Germany K. Walzer, Heliatek GmbH, Germany |
| Correspondent: | Click to Email |
Nanostructured surfaces and thin films of small organic molecules, polymers or hybrid materials are promising interfaces for versatile applications like sensing, water purification, nanoelectronics, energy production and energy storage devices. Ellipsometry, as non-invasive method, is well suited to contribute to the understanding of structure – property – relationships in organic thin films, but can also act as probing technique for hybrid sensing elements. Aspects from our research ranging from switchable responsive polymer brush interfaces for biosensing to thin films of small organic molecules for organic solar cells will be presented. On the one hand, swelling of polymer brushes grafted to slanted columnar thin films of silicon will be visualized by anisotropic optical contrast microscopy, as an example for a new class of hybrid sensing materials with unique sensitivity on the nanoscale. On the other hand the effect of template molecules on the morphology and optical properties of semiconducting thin films will be discussed, emphasizing the correlation of ellipsometric data with structural analysis by grazing incidence wide angle X-ray scattering (GIWAXS).