AVS 66th International Symposium & Exhibition
    Atomic Scale Processing Focus Topic Wednesday Sessions

Session AP+BI+PS+TF-WeM
Surface Reaction Analysis and Emerging Applications of Atomic Scale Processing

Wednesday, October 23, 2019, 8:00 am, Room B130
Moderator: Eric A. Joseph, IBM T.J. Watson Research Center


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:00am AP+BI+PS+TF-WeM1 Invited Paper
Open Spaces in Al2O3 Film Deposited on Widegap Semiconductors Probed by Monoenergetic Positron Beams
Akira Uedono, University of Tsukuba, Japan, T. Nabatame, NIMS, Japan, W. Egger, T. Koschine, Universität der Bundeswehr München, Germany, C. Hugenschmidt, M. Dickmann, Technische Universität München, Germany, M. Sumiya, NIMS, Japan, S. Ishibashi, AIST, Japan
8:40am AP+BI+PS+TF-WeM3
Surface Reaction Analyses of Atomic-layer Etching by Controlled Beam Experiments
Kazuhiro Karahashi, T. Ito, S. Hamaguchi, Osaka University, Japan
9:00am AP+BI+PS+TF-WeM4
Surface Reaction Analysis of Fluorine-based Reactive Ion Etching (RIE) and Atomic Layer Etching (ALE) by Molecular Dynamics (MD) Simulation
Erin Joy Tinacba, M. Isobe, K. Karahashi, S. Hamaguchi, Osaka University, Japan
9:20am AP+BI+PS+TF-WeM5
Analysis of Metal Surface during Atomic Layer Etching with Gas Cluster Ion Beam and Organic Acid
Noriaki Toyoda, K. Uematsu, University of Hyogo, Japan
9:40am AP+BI+PS+TF-WeM6
In-situ Characterization of Growth Kinetics of Piezoelectric Films Grown by Atomic Layer Deposition Utilizing an Ultra-high Purity Process Environment
Nicholas Strnad, General Technical Services, LLC, D.M. Potrepka, U.S. Army Research Laboratory, N. O'Toole, G.B. Rayner, Kurt J. Lesker Company, J.S. Pulskamp, U.S. Army Research Laboratory
11:00am AP+BI+PS+TF-WeM10 Invited Paper
Nanoscale Surface Modification of Medical Devices using Accelerated Neutral Atom Beam Technology
Dmitry Shashkov, J. Khoury, B. Phok, Exogenesis Corp.
11:40am AP+BI+PS+TF-WeM12
Chemically Enhanced Patterning of Nickel for Next Generation EUV Mask
Xia (Gary) Sang, E. Chen, University of California, Los Angeles, T. Tronic, C. Choi, Intel Corporation, J.P. Chang, University of California, Los Angeles
12:00pm AP+BI+PS+TF-WeM13
Surface Reactions of Low Energy Electrons and Ions with Organometallic Precursors and their Relevance to Charged Particle Deposition Processes
Rachel Thorman, Johns Hopkins University, E. Bilgilisoy, FAU Erlangen-Nürnberg, Germany, S. Matsuda, L. McElwee-White, University of Florida, D. Fairbrother, Johns Hopkins University