AVS 65th International Symposium & Exhibition | |
Nanometer-scale Science and Technology Division | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
NS-ThP1 Intermolecular Interactions in Self-Assembled Monolayers on Metal Surfaces Characterized by Ultrahigh Vacuum Tip-Enhanced Raman Spectroscopy J. Schultz, P. Whiteman, Nan Jiang, University of Illinois at Chicago |
NS-ThP2 Nanoscale Detection of Surface Plasmon-driven Hot Electron Flux on Au/TiO2 Nanodiodes with Atomic Force Microscopy Hyunhwa Lee, Korea Advanced Institute of Science and Technology (KAIST), Republic of Korea, H. Lee, Institute for Basic Science (IBS), Republic of Korea, J.Y. Park, Korea Advanced Institute of Science and Technology (KAIST), Republic of Korea |
NS-ThP3 Surface Functionalization of 2D Mo2C Yang Zeng, P.H. McBreen, T. Zhang, Laval University, Canada |
NS-ThP4 a-Si:H Spacer Lithography Using Different Mandrels (Al, SiNx and Photoresist) and Etching Processes (RIE, ECR and ICP) Andressa Rosa, J.A. Diniz, UNICAMP, Brazil |
NS-ThP6 Fabrication of Carbon Nanotube-Based Electronic Devices with the Dielectrophoresis Method Joevonte Kimbrough, S. Chance, B. Whitaker, Z. Duncan, K. Davis, A. Henderson, Q. Yuan, Z. Xiao, Alabama A&M University |
NS-ThP7 Fabrication and Electrical Characterization of a Flagella-Scaffolded Metallic Nanocluster Network Marko Chavez, P.J. Edwards, M.Y. El-Naggar, V.V. Kresin, University of Southern California |
NS-ThP8 High-contrast Infrared Polymer Photonic Crystals Fabricated by Direct Laser Writing Yanzeng Li, D.B. Fullager, S. Park, University of North Carolina at Charlotte, D. Childers, USC Conec, Ltd., G.D. Boreman, T. Hofmann, University of North Carolina at Charlotte |
NS-ThP9 Controlled Water-repellent Behavior by Modulating the Density of Nanoscale Si Nanopillar Structure Fabricated with Bio-template and Neutral Beam Etching Technique Daisuke Ohori, S. Samukawa, Tohoku University, Japan |
NS-ThP12 The TESLA JT SPM Markus Maier, D. Stahl, A. Piriou, M. Fenner, J. Koeble, K. Winkler, T. Roth, Scienta Omicron GmbH, Germany |
NS-ThP14 Novel In-situ Diagnostic tools to Analyze Chemical Composition and Energy Spectrum of Vapor in Thin Film Deposition Process Mikhail Strikovski, S.H. Kolagani, Neocera LLC |
NS-ThP16 High Fidelity and Sustainable Anti-reflective Moth-eye Nanostructures and Large Area Sub-wavelength Applications Shuhao Si, Technische Universität Ilmenau, Germany, M. Hoffmann, Ruhr-Universität Bochum, Germany |
NS-ThP18 Indirect Transition and Opposite Circular Polarization of Interlayer Exciton in a MoSe2/WSe2 van der Waals Heterostructure Hsun-Jen Chuang, A.T. Hanbicki, M. Rosenberger, C.S. Hellberg, S.V. Sivaram, K.M. McCreary, I. Mazin, B.T. Jonker, Naval Research Laboratory |
NS-ThP21 The Silicon Atomic Layer Etching by Two-step PEALD Consisting of Oxidation and (NH4)2SiF6 formation E.-J. Song, Korea Institute of Materials Science, Republic of Korea, J.-H. Ahn, Korea Maritime and Ocean University, Republic of Korea, Jung-Dae (J.-D.) Kwon, Korea Institute of Materials Science, Republic of Korea, S.-H. Kwon, Pusan National University, Republic of Korea |